Abstract: A cargo handling system includes: a first detection unit configured to detect a cargo on a pallet held by a fork of a forklift as a loaded state together with the pallet using at least one type of sensor before cargo handling work is started; a first abnormality determination unit configured to determine whether the loaded state detected by the first detection unit is abnormal; a second detection unit configured to detect a work situation using a plurality of types of sensors after the cargo handling work is started; and a second abnormality determination unit configured to determine whether the work situation detected by the second detection unit is abnormal.

Abstract: An electron microscope includes an electron optical system, and a control unit that controls the electron optical system. The control unit performs processing for determining a standard deviation of a brightness distribution of an electron microscope image; processing for determining an optimum value of a parameter of the electron optical system such that the standard deviation becomes the maximum, by Gaussian process regression; and processing for capturing the electron microscope image with setting a value of the parameter to the optimum value. The control unit repeats the processing for determining the standard deviation, the processing for determining the optimum value, and the processing for capturing the electron microscope image to determine a value of the parameter.

Abstract: An aberration value estimator has a learned estimation model for estimating an aberration value set based on a Ronchigram. In a machine learning sub-system, a simulation is repeatedly executed while changing a simulation condition, and calculated Ronchigrams are generated in a wide variety and in a large number. By machine learning using the calculated Ronchigrams, the learned estimation model is generated.

Abstract: An anomaly detection device includes processing circuitry and a memory. The memory stores map data and association data. The map data defines a map. The map receives, as input data, manipulation value data and the image data of the vehicle, thereby outputting, as output data, a state ID corresponding to an anomaly state related to the vehicle. The association data associates an anomaly state related to the vehicle with the state ID. The processing circuitry is configured to acquire the manipulation value data, acquire the image data from a camera mounted in the vehicle, input, as the input data, the manipulation value data and the image data, to the map, thereby acquiring, as the output data, the state ID from the map, and identify the anomaly state related to the vehicle based on the state ID acquired from the map and the association data.

Abstract: A method of measuring an aberration in an electron microscope includes: acquiring an image for measuring the aberration in the electron microscope; and measuring the aberration by using the image. In measuring the aberration, a direction of defocusing is specified based on a residual aberration that is uniquely determined by a configuration of an optical system of the electron microscope and an optical condition of the optical system.

Abstract: Prior to execution of primary correction, a first centering process, an in-advance correction of a particular aberration, and a second centering process are executed stepwise. In the first centering process and the second centering process, a ronchigram center is identified based on a ronchigram variation image, and is matched with an imaging center. In the in-advance correction and the post correction of the particular aberration, a particular aberration value is estimated based on a ronchigram, and the particular aberration is corrected based on the particular aberration value.

Abstract: A scanning transmission electron microscope that scans a specimen with an electron probe to acquire an image. The scanning transmission electron microscope includes: an optical system which includes a condenser lens and an objective lens; an imaging device which is arranged on a back focal plane or a plane conjugate to the back focal plane of the objective lens and which is capable of photographing a Ronchigram; and a control unit which performs adjustment of the optical system. The control unit is configured or programed to: acquire an image of a change in a Ronchigram that is attributable to a change in a relative positional relationship between the specimen and the electron probe; and determine a center of the Ronchigram based on the image of the change in the Ronchigram.

Abstract: An aberration value estimator has a learned estimation model for estimating an aberration value set based on a Ronchigram. In a machine learning sub-system, a simulation is repeatedly executed while changing a simulation condition, and calculated Ronchigrams are generated in a wide variety and in a large number. By machine learning using the calculated Ronchigrams, the learned estimation model is generated.

Abstract: A method of measuring an aberration in an electron microscope includes: acquiring an image for measuring the aberration in the electron microscope; and measuring the aberration by using the image. In measuring the aberration, a direction of defocusing is specified based on a residual aberration that is uniquely determined by a configuration of an optical system of the electron microscope and an optical condition of the optical system.

Abstract: A scanning transmission electron microscope that scans a specimen with an electron probe to acquire an image. The scanning transmission electron microscope includes: an optical system which includes a condenser lens and an objective lens; an imaging device which is arranged on a back focal plane or a plane conjugate to the back focal plane of the objective lens and which is capable of photographing a Ronchigram; and a control unit which performs adjustment of the optical system. The control unit is configured or programed to: acquire an image of a change in a Ronchigram that is attributable to a change in a relative positional relationship between the specimen and the electron probe; and determine a center of the Ronchigram based on the image of the change in the Ronchigram.

Abstract: The shape of a moving object is reconstructed from a shot image under relatively-strong ambient light or an embedded image is demodulated from a video image in which an image that may not be visually recognized is embedded to display the image. The image processing method of the present invention includes irradiating flashing light to the surface of the object based on a spreading signal obtained by spread spectrum modulation, receiving reflected light from the surface of the object to output the signal including the image information, a filtering for eliminating noise including a low-frequency component from the signal including the image information, inverse-spreading the signal after the filtering to demodulate the signal, and outputting, based on a signal obtained by the demodulation, an image reflecting the state of the surface of the object.

Abstract: The shape of a moving object is reconstructed from a shot image under relatively-strong ambient light or an embedded image is demodulated from a video image in which an image that may not be visually recognized is embedded to display the image. The image processing method of the present invention includes irradiating flashing light to the surface of the object based on a spreading signal obtained by spread spectrum modulation, receiving reflected light from the surface of the object to output the signal including the image information, a filtering for eliminating noise including a low-frequency component from the signal including the image information, inverse-spreading the signal after the filtering to demodulate the signal, and outputting, based on a signal obtained by the demodulation, an image reflecting the state of the surface of the object.

Abstract: There is provided an electron microscope capable of recording images in a shorter time. The electron microscope (100) includes: an illumination system (4) for illuminating a sample (S) with an electron beam; an imaging system (6) for focusing electrons transmitted through the sample (S); an electron deflector (24) for deflecting the electrons transmitted through the sample (S); an imager (28) having a photosensitive surface (29) for detecting the electrons transmitted through the sample (S), the imager (28) being operative to record focused images formed by the electrons transmitted through the sample (S); and a controller (30) for controlling the electron deflector (24) such that an active electron incident region (2) of the photosensitive surface (29) currently hit by the beam is varied in response to variations in illumination conditions of the illumination system (4).

Abstract: There is provided a scanning transmission electron microscope capable of producing plural types of STEM (scanning transmission electron microscopy) images using a single detector. The electron microscope (100) has an electron source (10) emitting an electron beam, a scanning deflector (13) for scanning the beam over a sample (S), an objective lens (14) for focusing the beam, an imager (22) placed at a back focal plane of the objective lens (14) or at a plane conjugate with the back focal plane, and a scanned image generator (40) for generating scanned images on the basis of images captured by the imager.

Abstract: There is provided a scanning transmission electron microscope capable of producing plural types of STEM (scanning transmission electron microscopy) images using a single detector. The electron microscope (100) has an electron source (10) emitting an electron beam, a scanning deflector (13) for scanning the beam over a sample (S), an objective lens (14) for focusing the beam, an imager (22) placed at a back focal plane of the objective lens (14) or at a plane conjugate with the back focal plane, and a scanned image generator (40) for generating scanned images on the basis of images captured by the imager.

Abstract: There is provided an electron microscope capable of recording images in a shorter time. The electron microscope (100) includes: an illumination system (4) for illuminating a sample (S) with an electron beam; an imaging system (6) for focusing electrons transmitted through the sample (S); an electron deflector (24) for deflecting the electrons transmitted through the sample (S); an imager (28) having a photosensitive surface (29) for detecting the electrons transmitted through the sample (S), the imager (28) being operative to record focused images formed by the electrons transmitted through the sample (S); and a controller (30) for controlling the electron deflector (24) such that an active electron incident region (2) of the photosensitive surface (29) currently hit by the beam is varied in response to variations in illumination conditions of the illumination system (4).

Abstract: A high-density shape reconstruction is conducted in measuring animal bodies as well. An image processing system has a projection device, an imaging device, and an image processing apparatus connected to the projection device and the imaging device, wherein the projection device projects a projected pattern to an observation target, the imaging device captures the projected pattern, and the image processing apparatus performs shape reconstruction based on an input image including the projected pattern. The image processing apparatus includes a unit for fetching the input image captured by the imaging device and performing line detection for the projected pattern projected by the projection device, wherein the projected pattern is a grid pattern formed of wave lines; and a unit for performing shape reconstruction by associating intersection points of vertical and horizontal lines extracted by the line detection with the projected pattern.

Abstract: A high-density shape reconstruction is conducted in measuring animal bodies as well. An image processing system has a projection device, an imaging device, and an image processing apparatus connected to the projection device and the imaging device, wherein the projection device projects a projected pattern to an observation target, the imaging device captures the projected pattern, and the image processing apparatus performs shape reconstruction based on an input image including the projected pattern. The image processing apparatus includes a unit for fetching the input image captured by the imaging device and performing line detection for the projected pattern projected by the projection device, wherein the projected pattern is a grid pattern formed of wave lines; and a unit for performing shape reconstruction by associating intersection points of vertical and horizontal lines extracted by the line detection with the projected pattern.

Abstract: Provided are an image processing device, an image processing method, and a program which are capable of high density restoration and which are also strong to image processing. An image processing device mainly consists of a projector serving as a projection means, a camera as a photographing means, and an image processing means consisting of, for example, a personal computer. The image processing means acquires the intersection point between patterns from a photographed image and calculates a first solution including degree of freedom by using the constraint condition of a first tentative plane and a second tentative plane including the intersection point and the constraint condition obtained from the positional relationship between the projector and the camera. The degree of freedom is cancelled by primary search, thereby restoring a three-dimensional shape.

Abstract: The present invention discloses a capsule endoscope image display controller (26) including: an image-to-image similarity calculating unit (36) that calculates, for each image included in an image sequence captured by a capsule endoscope which moves within the digestive organs, a similarity between the image and its temporally consecutive image; an amount-of-movement calculating unit (47) that calculates, for each image included in the image sequence, an amount of movement of a feature area included in the image; a video state classifying unit (41) that classifies, for each image included in the image sequence, a video state of the image into one of the following states, based on the video state, the similarity, and the amount of movement of the image: (a) “stationary state” indicating that the capsule endoscope is stationary, (b) “digestive organs deformation state” indicating that the digestive organs are deformed, and (c) “capsule moving state” indicating that the capsule endoscope is moving, based on the