Patents by Inventor Sébastien BAYON

Sébastien BAYON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10088526
    Abstract: A tester for integrated circuits on a silicon wafer includes an input/output connection for testing an integrated circuit. The tester comprises circuitry arranged for transferring a first data frame to the integrated circuit via the input/output connection, the first data frame including a time reference for the data included in the data frame, a field for validating the time reference and a data field including at least one test command and for receiving a second data frame via the input/output connection, the data in the second data frame received having a duration that is a multiple of the time reference.
    Type: Grant
    Filed: March 1, 2016
    Date of Patent: October 2, 2018
    Assignee: STARCHIP
    Inventors: Cyrille Lambert, Sébastien Bayon, Alexandre Croguennec
  • Publication number: 20160259002
    Abstract: A tester for integrated circuits on a silicon wafer may include an input/output connection for testing an integrated circuit and circuitry causing the tester to perform: transferring a data frame to the integrated circuit via the input/output connection, the data frame including a time reference for the data included in the data frame, a field for validating the time reference and a data field including at least one integrated-circuit test command; and receiving a data frame via the input/output connection, the data in the data frame received having a duration that is a multiple of the time reference.
    Type: Application
    Filed: March 1, 2016
    Publication date: September 8, 2016
    Applicant: STARCHIP
    Inventors: Cyrille LAMBERT, Sébastien BAYON, Alexandre CROGUENNEC