Abstract: A method of capturing signals during hardware verification of a circuit design utilizes at least one field-programmable gate array (FPGA) and includes selecting, at run time and using one or more pre-compiled macros, a group of signals to be captured during verification of the circuit design and storing values of the group of signals in at least first and second random access memories disposed in the at least one FPGA. The first and second random access memories may be addressable spaces of the same random access memory.

Abstract: A method of capturing signals during hardware verification of a circuit design utilizes at least one field-programmable gate array (FPGA) and includes selecting, at run time and using one or more pre-compiled macros, a group of signals to be captured during verification of the circuit design and storing values of the group of signals in at least first and second random access memories disposed in the at least one FPGA. The first and second random access memories may be addressable spaces of the same random access memory.

Abstract: A method of capturing signals during hardware verification of a circuit design utilizes at least one field-programmable gate array (FPGA) and includes selecting, at run time and using one or more pre-compiled macros, a group of signals to be captured during verification of the circuit design and storing values of the group of signals in at least first and second random access memories disposed in the at least one FPGA. The first and second random access memories may be addressable spaces of the same random access memory.

Abstract: A hardware verification system according to one embodiment includes, in part, a plurality of programmable devices. The plurality of programmable devices include a master scheduler, a plurality of schedulers and a plurality of programmable delay elements. A first one of the plurality of schedulers is configured to receive one or more delay values associated with one or more of the plurality of delay elements. Each of the plurality of programmable delay elements corresponds to a delay. The first scheduler is further configured to send a parameter corresponding to the one or more delay values to the master scheduler, and generate one or more signals corresponding to the one or more delay elements in response to a control signal the first scheduler receives from the master scheduler.

Abstract: A hardware verification system according to one embodiment includes, in part, a plurality of programmable devices. The plurality of programmable devices include a master scheduler, a plurality of schedulers and a plurality of programmable delay elements. A first one of the plurality of schedulers is configured to receive one or more delay values associated with one or more of the plurality of delay elements. Each of the plurality of programmable delay elements corresponds to a delay. The first scheduler is further configured to send a parameter corresponding to the one or more delay values to the master scheduler, and generate one or more signals corresponding to the one or more delay elements in response to a control signal the first scheduler receives from the master scheduler.

Abstract: Embodiments relate to the emulation of circuits, and detecting an event in a plurality of signals in an emulated circuit. A host system incorporates global event detection logic into a design under test (DUT). An emulator emulates the DUT along with the incorporated global event detection logic. The global event detection logic divides one clock cycle of the DUT into multiple time periods. During each time period of the clock cycle, the emulator selects a different subset of signals from the plurality of signals of the DUT. The emulator determines whether an event occurred for a signal from the subset during the clock cycle. If an event is detected, the emulator generates an output indicating an event was detected among the plurality of signals.

Abstract: Embodiments relate to the emulation of circuits, and detecting an event in a plurality of signals in an emulated circuit. A host system incorporates global event detection logic into a design under test (DUT). An emulator emulates the DUT along with the incorporated global event detection logic. The global event detection logic divides one clock cycle of the DUT into multiple time periods. During each time period of the clock cycle, the emulator selects a different subset of signals from the plurality of signals of the DUT. The emulator determines whether an event occurred for a signal from the subset during the clock cycle. If an event is detected, the emulator generates an output indicating an event was detected among the plurality of signals.