Patents by Inventor S V Raj Kumar Bolisetti

S V Raj Kumar Bolisetti has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11640659
    Abstract: There are provided methods and systems for assessing the health of an asset. For example, a system is provided. The system may include a processor and a memory including instructions that, when executed by the processor, cause the processor to perform operations consistent with identifying a defect in a component of an asset. The operations may include fetching from an inspection system, a plurality of images acquired from an inspection of the component of the asset by the inspection system. The operations may include identifying, based on an image processing technique codified and included as part of the instructions, a subset of images from the plurality of images. The subset of images is representative of the defect in the component of the asset, and the image processing technique is selected from the group consisting of an auto-distress ranking technique, a structural similarity technique, a mean-subtracted filtering technique, and a Hessian norm computation technique.
    Type: Grant
    Filed: January 14, 2021
    Date of Patent: May 2, 2023
    Assignee: General Electric Company
    Inventors: S V Raj Kumar Bolisetti, Rajani M. Poornima, Ashok Kumaraswamy, Vishnu Tatiparthi, Lakshmy Narayanan, Vamshi Krishna Reddy Kommareddy, Aditya Bhakta, Raja Vardhan Movva, Debasish Mishra
  • Publication number: 20210217155
    Abstract: There are provided methods and systems for assessing the health of an asset. For example, a system is provided. The system may include a processor and a memory including instructions that, when executed by the processor, cause the processor to perform operations consistent with identifying a defect in a component of an asset. The operations may include fetching from an inspection system, a plurality of images acquired from an inspection of the component of the asset by the inspection system. The operations may include identifying, based on an image processing technique codified and included as part of the instructions, a subset of images from the plurality of images. The subset of images is representative of the defect in the component of the asset, and the image processing technique is selected from the group consisting of an auto-distress ranking technique, a structural similarity technique, a mean-subtracted filtering technique, and a Hessian norm computation technique.
    Type: Application
    Filed: January 14, 2021
    Publication date: July 15, 2021
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: S V Raj Kumar Bolisetti, Rajani M. Poornima, Ashok Kumaraswamy, Vishnu Tatiparthi, Lakshmy Narayanan, Vamshi Krishna Reddy Kommareddy, Aditya Bhakta, Raja Vardhan Movva, Debasish Mishra