Abstract: Generation of a random sequence using alpha particle emissions is described. A device includes memory cells, an alpha particle emitter, and read circuitry. The memory cells are sensitive to alpha particle emissions. The alpha particle emitter is proximate to the memory cells for changing state of one or more bits of the memory cells within a period of time. The read circuitry is coupled to the memory cells and configured to periodically issue a read command to periodically read the memory cells.

Abstract: A true random number generator may comprise a multi-gigabit transceiver with a transceiver to receive a signal of predetermined source data. Recovery circuitry of the transceiver may be operable to recover data from the received signal. A controller may stress the recovery circuit to cause a portion of the data recovered to differ from the respective portion of the predetermined source data. An extractor may define numbers for a true random number sequence based on differences between the recovered data and the predetermined serial source data over an interval of time. In a particular example, the controller may influence at least one of the serial data transfer rate, the number of sequential same-state bits for the predetermined source data, and the stability of a clock signal to be recovered by a portion of the recovery circuit.

Abstract: A Programmable Logic Device (PLD), such as a Field Programmable Gate Array (FPGA), is provided with components of a Radio Frequency Identification (RFID) tag and circuitry to enhance operation. The RFID antenna and circuitry is provided in either directly in layers of the die forming the PLD, on a die package containing the PLD die, or on a printed circuit board containing the PLD. An RFID antenna provides a source of power from an external electromagnetic radiation source (such as an RFID reader) during storage of the PLD to prevent loss of decryption software in volatile memory should batteries run down. The RFID antenna can further provide a path for providing a bitstream to program the PLD as well as to read data to verify programming. With multiple PLDs having RFID antennas, programming of the PLDs can be performed in parallel. Further, the RFID antenna can be used with limited PLD resources to identify the PLD for inventory.

Abstract: A built in self test (BIST) circuit is provided for a programmable logic device (PLD) constructed from fixed or hard core logic that includes circuitry to write recurring patterns of bits in the configuration memory in a frame by frame manner and read the cell state to enable the validation of every configuration bit at power up. The BIST circuitry can further be used to program the recurring patterns into the configuration memory, and then read frames of the configuration memory to detect the occurrence of single event upsets (SEU) that corrupt data in the configuration memory. The recurring patterns programmed do not require time consuming functional configuration of the PLD, and can be done in a production environment after power up without knowledge of how the PLD will later be configured. No soft logic is needed to form the BIST circuit, enabling 100% test coverage of the programmable configuration memory cells.

Abstract: A circuit for implementing a plurality of circuits on a programmable logic device, the circuit comprising a first circuit implemented on a first portion of the programmable logic device; a second circuit implemented on a second portion of the programmable logic device; and a control circuit coupled to the first circuit and the second circuit, the control circuit providing isolation between the first circuit and the second circuit. While the first circuit and the second circuit may comprise redundant circuits implementing a common function, the circuits may also comprise circuits which must be isolated, such as an encryption circuit and a decryption circuit implementing a cryptographic function. A method for implementing a plurality of circuits on a programmable logic device is also disclosed.

Abstract: The performance of a serial data transceiver in a programmable logic device may be determined by applying a stress sequence of sequential data to a receiver of the transceiver, comparing the received data to reference data and determining the number of errors.