Patents by Inventor Sabbir M. Mian

Sabbir M. Mian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films
    Patent number: 6731380
    Abstract: A beam deflection technique for simultaneous measurements of the thickness, refractive index and optical absorption of transparent materials using a charge coupled device (CCD) camera is provided. The method comprises measuring beam deflection after transmission through or reflection off a sample of interest at variable incidence angles to the sample surface. The measurement of beam deflection as a function of incident angle is related through Snell's Law directly to the sample thickness and sample index of refraction.
    Type: Grant
    Filed: June 18, 2001
    Date of Patent: May 4, 2004
    Assignee: Applied Optics Center of Delaware, Inc.
    Inventors: Mohamed Kamel Amara, Noureddine Melikechi, Sabbir M. Mian