Abstract: A training data generation device includes: cut-out unit that receives an input of an image of an inspection target, specifies an inspection area of the inspection target in the image by a predetermined method, and cuts out the specified inspection area from the image; sorting unit that, on the basis of a sorting operation of sorting, as a learning-target image, an image of the inspection area cut out in the cut-out unit into at least either normal or non-normal, associates the learning-target image and a result of the sorting with each other; and training data memory unit that stores training data in which the learning-target image and the result of the sorting are associated with each other.

Abstract: A training data generation device that can rapidly generate a large amount of training data to be input into a learning program is provided. The training data generation device generates training data to be used in machine learning. A learned model generated by the machine learning using the training data generated by the training data generation device is used in an inspection device that performs inspection for determining whether or not an inspection target is a normal product by inputting an image capturing the inspection target into the learned model.

Abstract: An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).

Abstract: An X-ray inspection apparatus includes: an X-ray emission unit for emitting an X-ray to an object; an X-ray detection unit for detecting each X-ray photon transmitted through the object by discriminating energy possessed by the photon into one or more energy region(s) in accordance with a predetermined threshold level; a storage unit for storing the object and the associated threshold level; a threshold level setting unit for referring to the storage unit to keep a threshold level for the object specified by inputted information so that the X-ray detection unit can refer to the threshold level as the predetermined threshold level; and an inspection unit for inspecting the object based on a number of photons or an amount corresponding to the number of the photons detected by the X-ray detection unit for each of the one or more energy region(s).