Patents by Inventor Sachiko Ebihara

Sachiko Ebihara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor device tester with a test waveform monitoring circuit
    Patent number: 5107205
    Abstract: A tester for semiconductor devices such as IC memory chips is provided with an improved test waveform simulating function. The test waveform simulating circuit comprises relays for selecting one of the outputs of a plurality of drivers. The driver output selected by a relay is compared by a comparator with reference levels at reference times recurring at short intervals, thereby producing information bits corresponding to the waveform of the driver output which is displayed as a two dimensional image through a memory and display.
    Type: Grant
    Filed: October 19, 1990
    Date of Patent: April 21, 1992
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventor: Sachiko Ebihara
  • Burn-in apparatus
    Patent number: 5021733
    Abstract: A burn-in apparatus includes burn-in boards for holding semiconductor devices through air suction and for electrically connecting them to external equipment. Since the semiconductor devices are held on the burn-in boards for electrical connection through air suction, sockets are not necessary to hold them on the boards which reduces costs. Further, the leads of semiconductor devices, which have conventionally been susceptible to bending when inserted into or extracted from the sockets, can be protected.
    Type: Grant
    Filed: January 11, 1990
    Date of Patent: June 4, 1991
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Sachiko Ebihara, Yasuhiko Fukushima