Abstract: A paper-constructed object usable to form a high strength structure is itself formed using a fiber-powder paper product. The fiber-powder paper product is formed from a biodegradable plastic base material and fiber-powder surface coating material. The fiber-powder surface coating material is applied to at least one surface of the biodegradable plastic base material. The paper-constructed object includes a top sheet, a middle sheet and a bottom sheet of the fiber-powder paper. The middle sheet has a plurality of projections formed in it. The projections can be pyramidal, with a square base and side surfaces that are equilateral triangles. The plurality of equilateral 4-sided pyramidal projections are contiguous and extend between the top and bottom sheets. The four base edges of the equilateral 4-sided pyramidal projections are bonded to the bottom sheet and the tips of the equilateral 4-sided pyramidal projections are bonded to the top sheet.

Abstract: A papermaking process, and a paper product made from the process, wherein a biodegradable plastic is used with papermaking material. The biodegradeable plastic may be provided as a substrate, with the papermaking material being applied to the substrate. The papermaking material may include recycled paper fibers and/or agricultural crop material. Recycled wood fibers may be applied in a fibrous state or agricultural plant material may be powdered and applied to the substrate. The surface material is affixed to the substrate by the application of heat and pressure or by the use of vegetable slime juice as an adhesive.

Abstract: A test timing condition setting program generator for automatically generating a test timing condition program. Waveforms indicating product inspection specifications are input using a waveform input editor, a timing value being attached to each waveform. Using the timing values, an intermediate data generation unit generates intermediate data. Though format of the intermediate data is converted into a test program format acceptable to a particular semiconductor tester by a translator, thereby automatically generating a source program of a test timing condition setting program.