Abstract: A method includes obtaining, by a processing device, data indicative of locations of defects of a substrate. The method further includes generating an image indicating the locations of the defects. The method further includes providing the image indicating the locations of the defects to a trained machine learning model. The method further includes obtaining, as output from the trained machine learning model, a classification of the locations of the defects. The method further includes performing a corrective action in view of the output from the trained machine learning model.

Abstract: A method of inducing sparsity for outputs of neural network layer may include receiving outputs from a layer of a neural network; partitioning the outputs into a plurality of partitions; identifying first partitions in the plurality of partitions that can be treated as having zero values; generating an encoding that identifies locations of the first partitions among remaining second partitions in the plurality of partitions; and sending the encoding and the second partitions to a subsequent layer in the neural network.