Abstract: An approach is provided in which an information handling system executes multiple timing constraint sensitivity tests on a circuit model using a first signal arrival time and generates multiple test results. The information handling system compares the multiple test results with a pre-determined probability threshold and, in response to determining that an amount of test failures included in the multiple test results meets a pre-determined failure probability threshold, the information handling system computes a timing constraint sensitivity of the circuit model based upon the first signal arrival time.

Abstract: An approach is provided in which an information handling system executes multiple timing constraint sensitivity tests on a circuit model using a first signal arrival time and generates multiple test results. The information handling system compares the multiple test results with a pre-determined probability threshold and, in response to determining that an amount of test failures included in the multiple test results meets a pre-determined failure probability threshold, the information handling system computes a timing constraint sensitivity of the circuit model based upon the first signal arrival time.

Abstract: An approach is provided in which an information handling system executes multiple timing constraint sensitivity tests on a circuit model using a first signal arrival time and generates multiple test results. The information handling system compares the multiple test results with a pre-determined probability threshold and, in response to determining that an amount of test failures included in the multiple test results meets a pre-determined failure probability threshold, the information handling system computes a timing constraint sensitivity of the circuit model based upon the first signal arrival time.

Abstract: An approach is provided in which an information handling system executes multiple timing constraint sensitivity tests on a circuit model using a first signal arrival time and generates multiple test results. The information handling system compares the multiple test results with a pre-determined probability threshold and, in response to determining that an amount of test failures included in the multiple test results meets a pre-determined failure probability threshold, the information handling system computes a timing constraint sensitivity of the circuit model based upon the first signal arrival time.