Patents by Inventor SACHIN KRISHNE GOWDA

SACHIN KRISHNE GOWDA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Approach to correct ECC errors using duplicate copies of data
    Patent number: 9703629
    Abstract: Devices and methods implemented therein in are disclosed for correcting errors in data. The method comprises determining that a first copy of data and a second copy of data include errors uncorrectable by an error correction code (ECC) engine. The ECC engine is modified based on determining that the first copy of data and the second copy of data include errors uncorrectable by the ECC engine and using the modified ECC engine, the first copy of data and the second copy of data are processed to correct the errors in the first and second copy of the data.
    Type: Grant
    Filed: March 13, 2015
    Date of Patent: July 11, 2017
    Assignee: SanDisk Technologies LLC
    Inventors: Sateesh Desireddi, Nagi Reddy Chodem, Sachin Krishne Gowda
  • APPROACH TO CORRECT ECC ERRORS USING DUPLICATE COPIES OF DATA
    Publication number: 20160162357
    Abstract: Devices and methods implemented therein in are disclosed for correcting errors in data. The method comprises determining that a first copy of data and a second copy of data include errors uncorrectable by an error correction code (ECC) engine. The ECC engine is modified based on determining that the first copy of data and the second copy of data include errors uncorrectable by the ECC engine and using the modified ECC engine, the first copy of data and the second copy of data are processed to correct the errors in the first and second copy of the data.
    Type: Application
    Filed: March 13, 2015
    Publication date: June 9, 2016
    Applicant: SanDisk Technologies Inc.
    Inventors: Sateesh Desireddi, Nagi Reddy Chodem, Sachin Krishne Gowda
  • Systems and methods to update reference voltages of non-volatile memory
    Patent number: 9318215
    Abstract: A data storage device includes non-volatile memory and a controller. The controller is configured to read first data from the non-volatile memory. The first data indicates a first count of storage elements of the group that have a first activation status when sensed with a first reference voltage at a first time. The controller is configured to read second data from the non-volatile memory. The second data indicates a second count of storage elements of the group that have the first activation status when sensed with the first reference voltage at a second time. The controller is configured to generate an updated first reference voltage at least partially based on a difference between the first count and the second count and based on one or more parameters corresponding to a distribution of threshold voltages of storage elements at the first time.
    Type: Grant
    Filed: April 11, 2013
    Date of Patent: April 19, 2016
    Assignee: SANDISK TECHNOLOGIES INC.
    Inventors: Sateesh Desireddi, Sachin Krishne Gowda, Jayaprakash Naradasi, Anand Venkitachalam, Manuel Antonio D'Abreu, Stephen Skala
  • SYSTEMS AND METHODS TO UPDATE REFERENCE VOLTAGES OF NON-VOLATILE MEMORY
    Publication number: 20140226398
    Abstract: A data storage device includes non-volatile memory and a controller. The controller is configured to read first data from the non-volatile memory. The first data indicates a first count of storage elements of the group that have a first activation status when sensed with a first reference voltage at a first time. The controller is configured to read second data from the non-volatile memory. The second data indicates a second count of storage elements of the group that have the first activation status when sensed with the first reference voltage at a second time. The controller is configured to generate an updated first reference voltage at least partially based on a difference between the first count and the second count and based on one or more parameters corresponding to a distribution of threshold voltages of storage elements at the first time.
    Type: Application
    Filed: April 11, 2013
    Publication date: August 14, 2014
    Applicant: SANDISK TECHNOLOGIES INC.
    Inventors: SATEESH DESIREDDI, SACHIN KRISHNE GOWDA, JAYAPRAKASH NARADASI, ANAND VENKITACHALAM, MANUEL ANTONIO D'ABREU, STEPHEN SKALA