Patents by Inventor Sachio MURAKAMI

Sachio MURAKAMI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240132738
    Abstract: The present invention provides a polymeric dispersant that is to be blended in an aqueous pigment dispersion in which a pigment is finely dispersed in a stable manner and at a high level, the aqueous pigment dispersion enabling preparation of an aqueous inkjet ink capable of recording an image excellent in adhesiveness and durability on plastic media and textiles. The polymeric dispersant is a polymer that includes a constituent unit (i) derived from styrene, a constituent unit (ii) derived from methyl methacrylate and/or the like, a constituent unit (iii) derived from 2-ethylhexyl methacrylate and/or the like, a constituent unit (iv) derived from 2-hydroxyethyl methacrylate and/or the like, and a constituent unit (v) derived from methacrylic acid, and at least part of carboxy groups is neutralized with an alkali.
    Type: Application
    Filed: November 26, 2021
    Publication date: April 25, 2024
    Inventors: Hiroyuki SHIMANAKA, Katsuhiko KANO, Kosuke KUME, Chikako MIYAZAKI, Yoshikazu MURAKAMI, Sachio YOSHIKAWA
  • Patent number: 10539520
    Abstract: Provided is a sample-analyzing system used for identifying a target sample from its measurement data obtained using a plurality of analyzing devices including at least one device selected from a fluorescent X-ray analyzer, atomic absorption photometer and inductively coupled plasma emission analyzer as well as at least one device selected from an infrared spectrophotometer and Raman spectrophotometer.
    Type: Grant
    Filed: April 11, 2017
    Date of Patent: January 21, 2020
    Assignee: SHIMADZU CORPORATION
    Inventor: Sachio Murakami
  • Patent number: 10126250
    Abstract: A foreign substance analysis system capable of accurately and easily analyzing a foreign substance contained in a sample. The foreign substance analysis system includes an infrared spectrum acquisition step of acquiring infrared spectrum information of a sample measured by an infrared spectrophotometer; and a fluorescent X-ray spectrum acquisition step of acquiring fluorescent X-ray spectrum information of the sample measured by a fluorescent X-ray analyzer; and a determination step of determining whether or not an organic element is contained in the sample by comparing a ratio of an intensity of a Compton scattered ray and an intensity of a Rayleigh scattered ray in the fluorescent X-ray spectrum information with a set threshold value.
    Type: Grant
    Filed: August 30, 2017
    Date of Patent: November 13, 2018
    Assignee: Shimadzu Corporation
    Inventors: Sachio Murakami, Shoko Iwasaki, Tsuyoshi Tsuchibuchi
  • Publication number: 20170307551
    Abstract: Provided is a sample-analyzing system used for identifying a target sample from its measurement data obtained using a plurality of analyzing devices including at least one device selected from a fluorescent X-ray analyzer, atomic absorption photometer and inductively coupled plasma emission analyzer as well as at least one device selected from an infrared spectrophotometer and Raman spectrophotometer.
    Type: Application
    Filed: April 11, 2017
    Publication date: October 26, 2017
    Applicant: SHIMADZU CORPORATION
    Inventor: Sachio MURAKAMI