Patents by Inventor Sadao Takeuchi

Sadao Takeuchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8890058
    Abstract: The present invention provides a mass spectrometer having an ion lens capable of transporting an ion having a large mass to charge ratio with a high level of ion-passing efficiency even under a low-vacuum atmosphere. In conventional atmospheric pressure ionization mass spectrometers or similar mass spectrometers, applying an excessively high voltage to the ion lens undesirably causes an electric discharge. Therefore, the passing efficiency for an ion having a large mass to charge ratio cannot be adequately improved, which leads to a poor detection sensitivity. To solve this problem, the mass spectrometer according to the present invention includes a voltage controller 21 that controls a variable radiofrequency (RF) voltage generator 24 so that both the amplitude and the frequency of the RF voltage applied to the lens electrodes of an ion lens 5 are changed according to the mass to charge ratio of an ion to be analyzed.
    Type: Grant
    Filed: November 16, 2005
    Date of Patent: November 18, 2014
    Assignee: Shimadzu Corporation
    Inventors: Sadao Takeuchi, Hiroaki Waki, Li Ding, Roger Giles
  • Patent number: 8058610
    Abstract: A sample plate 3 with a sample 4 placed thereon is initially set on a stage 2, and a visual image of the sample is taken with a CCD camera 14. This image is stored in an image data memory 23. Then, an operator removes the sample plate 3, sprays a matrix for a MALDI process onto the sample 4 and replaces the plate onto the stage 2. After that, when a predetermined operation is made, a clear image of the sample taken before the application of the matrix is shown on a display unit 24. On this image, the operator specifies a point or area for the analysis. The sample 4 may have been displaced due to the removal and replacement of the plate 3. Accordingly, an image analyzer 44 calculates the direction and magnitude of the displacement, for example, by recognizing the position of the markings provided on the sample plate 3. A displacement corrector 42 computes coordinate values in which the displacement is corrected.
    Type: Grant
    Filed: December 5, 2006
    Date of Patent: November 15, 2011
    Assignee: Shimadzu Corporation
    Inventors: Takahiro Harada, Sadao Takeuchi, Kiyoshi Ogawa, Mitsutoshi Setou
  • Patent number: 7759640
    Abstract: In a mass spectrometer for carrying out mass analysis while microscopically observing a two-dimensional area of a sample 15, the observation position for selecting a target portion while observing an image of the sample 15 captured with a CCD camera 23 is separated from the analysis position for carrying out the mass analysis of the sample 15 by delivering laser light from the laser-delivering unit 20 onto the sample 15. The sample 15 is placed on a stage 13, which can be precisely moved between the observation position and the analysis position by a stage-driving mechanism 30. An observation optical system 24 can be set close to the sample 15 at the observation position, without impeding the flight of the ions generated from the sample 15 during the analysis or interfering with a laser-condensing optical system 22. Thus, the spatial resolution for observation is improved without deteriorating the ion-detecting efficiency.
    Type: Grant
    Filed: August 10, 2006
    Date of Patent: July 20, 2010
    Assignee: Shimadzu Corporation
    Inventors: Mitsutoshi Setou, Shuichi Shimma, Takahiro Harada, Sadao Takeuchi, Osamu Furuhashi, Kiyoshi Ogawa, Yoshikazu Yoshida
  • Publication number: 20100044563
    Abstract: A sample plate 3 with a sample 4 placed thereon is initially set on a stage 2, and a visual image of the sample is taken with a CCD camera 14. This image is stored in an image data memory 23. Then, an operator removes the sample plate 3, sprays a matrix for a MALDI process onto the sample 4 and replaces the plate onto the stage 2. After that, when a predetermined operation is made, a clear image of the sample taken before the application of the matrix is shown on a display unit 24. On this image, the operator specifies a point or area for the analysis. The sample 4 may have been displaced due to the removal and replacement of the plate 3. Accordingly, an image analyzer 44 calculates the direction and magnitude of the displacement, for example, by recognizing the position of the markings provided on the sample plate 3. A displacement corrector 42 computes coordinate values in which the displacement is corrected.
    Type: Application
    Filed: December 5, 2006
    Publication date: February 25, 2010
    Inventors: Takahiro Harada, Sadao Takeuchi, Kiyoshi Ogawa, Mitsutoshi Setou
  • Publication number: 20090146053
    Abstract: In a mass spectrometer for carrying out mass analysis while microscopically observing a two-dimensional area of a sample 15, the observation position for selecting a target portion while observing an image of the sample 15 captured with a CCD camera 23 is separated from the analysis position for carrying out the mass analysis of the sample 15 by delivering laser light from the laser-delivering unit 20 onto the sample 15. The sample 15 is placed on a stage 13, which can be precisely moved between the observation position and the analysis position by a stage-driving mechanism 30. An observation optical system 24 can be set close to the sample 15 at the observation position, without impeding the flight of the ions generated from the sample 15 during the analysis or interfering with a laser-condensing optical system 22. Thus, the spatial resolution for observation is improved without deteriorating the ion-detecting efficiency.
    Type: Application
    Filed: August 10, 2006
    Publication date: June 11, 2009
    Applicant: SHIMADZU CORPORATION
    Inventors: Mitsutoshi Setou, Shuichi Shimma, Takahiro Harada, Sadao Takeuchi, Osamu Furuhashi, Kiyoshi Ogawa, Yoshikazu Yoshida
  • Publication number: 20080283742
    Abstract: The present invention provides a mass spectrometer having an ion lens capable of transporting an ion having a large mass to charge ratio with a high level of ion-passing efficiency even under a low-vacuum atmosphere. In conventional atmospheric pressure ionization mass spectrometers or similar mass spectrometers, applying an excessively high voltage to the ion lens undesirably causes an electric discharge. Therefore, the passing efficiency for an ion having a large mass to charge ratio cannot be adequately improved, which leads to a poor detection sensitivity. To solve this problem, the mass spectrometer according to the present invention includes a voltage controller 21 that controls a variable radiofrequency (RF) voltage generator 24 so that both the amplitude and the frequency of the RF voltage applied to the lens electrodes of an ion lens 5 are changed according to the mass to charge ratio of an ion to be analyzed.
    Type: Application
    Filed: November 16, 2005
    Publication date: November 20, 2008
    Applicant: Shimadzu Corporation
    Inventors: Sadao Takeuchi, Hiroaki Waki, Li Ding, Roger Giles
  • Publication number: 20070114388
    Abstract: An imaging mass spectrometer, an image of a sample is generated, and a region in the image is selected in accordance with predetermined criteria. Then, a mass analysis of the region is performed while scanning the sample in the selected region with a laser beam spot. By computing the total or average of the results in the region, a high precision analytical value in the region can be obtained. In a biological sample, by preliminarily performing a staining process on the biological sample using a certain dye, only the objective tissues can be analyzed. Also, a fluorescence microscope can be used.
    Type: Application
    Filed: November 1, 2006
    Publication date: May 24, 2007
    Applicant: SHIMADZU CORPORATION
    Inventors: Kiyoshi Ogawa, Sadao Takeuchi, Takahiro Harada, Yoshihiro Ueno, Fujio Inoue, Mitsutoshi Setou