Patents by Inventor SADEEPA L. SEPALA

SADEEPA L. SEPALA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for identifying an edge of an object using laser distance measurement
    Patent number: 9677881
    Abstract: A method and apparatus for identifying an edge of a target object using laser distance measurement. The method comprises rotating a laser distance measuring head in intervals of a predetermined angle in a first direction. Further, at each step of rotation, directing a scan beam onto the target object at a point of incidence and measuring a distance between the laser distance measuring head and the point of incidence. When a difference between a measured distance at a first step of rotation and a measured distance at a second step of rotation exceeds beyond a predetermined threshold value, identifying, that an edge of the target object has occurred at the point of incidence of the scan beam corresponding to the second step of rotation, wherein the second step of rotation precedes the first step of rotation.
    Type: Grant
    Filed: December 19, 2013
    Date of Patent: June 13, 2017
    Assignee: Symbol Technologies, LLC
    Inventors: Sanjeewa Thimirachandra, Ruwan Jayanetti, Sadeepa L Sepala, Anuradha Tennakoon
  • METHOD AND APPARATUS FOR IDENTIFYING AN EDGE OF AN OBJECT USING LASER DISTANCE MEASUREMENT
    Publication number: 20150176987
    Abstract: A method and apparatus for identifying an edge of a target object using laser distance measurement. The method comprises rotating a laser distance measuring head in intervals of a predetermined angle in a first direction. Further, at each step of rotation, directing a scan beam onto the target object at a point of incidence and measuring a distance between the laser distance measuring head and the point of incidence. When a difference between a measured distance at a first step of rotation and a measured distance at a second step of rotation exceeds beyond a predetermined threshold value, identifying, that an edge of the target object has occurred at the point of incidence of the scan beam corresponding to the second step of rotation, wherein the second step of rotation precedes the first step of rotation.
    Type: Application
    Filed: December 19, 2013
    Publication date: June 25, 2015
    Applicant: SYMBOL TECHNOLOGIES, INC.
    Inventors: SANJEEWA THIMIRACHANDRA, RUWAN JAYANETTI, SADEEPA L. SEPALA, ANURADHA TENNAKOON