Abstract: A bond-wire system including a wire bond that is deflected above a dielectric ridge at a die edge. The deflected wire bond allows for both a lowered Z-profile and a reduced X-Y footprint. The bond-wire system may include a stacked-die configuration where a stacked die is wire bonded and the stacked-die bond wire is deflected above a dielectric ridge at the stacked die edge.

Abstract: A bond-wire system including a wire bond that is deflected above a dielectric ridge at a die edge. The deflected wire bond allows for both a lowered Z-profile and a reduced X-Y footprint. The bond-wire system may include a stacked-die configuration where a stacked die is wire bonded and the stacked-die bond wire is deflected above a dielectric ridge at the stacked die edge.

Abstract: One or more example embodiments of miniaturized electric devices are disclosed. In some example embodiments, the electric device includes a first thin substrate layer and a second thin substrate layer positioned above the first thin substrate layer. The electric device further includes one or more components electrically coupled to the first thin substrate layer. An overmold compound is deposited covering the one or more components between the first thin substrate and the second thin substrate. The electric device further includes one or more through mold vias that electrically and communicatively connect the first thin substrate layer and the second thin substrate layer.

Abstract: One or more example embodiments of miniaturized electric devices are disclosed. In some example embodiments, the electric device includes a first thin substrate layer and a second thin substrate layer positioned above the first thin substrate layer. The electric device further includes one or more components electrically coupled to the first thin substrate layer. An overmold compound is deposited covering the one or more components between the first thin substrate and the second thin substrate. The electric device further includes one or more through mold vias that electrically and communicatively connect the first thin substrate layer and the second thin substrate layer.

Abstract: One or more example embodiments of miniaturized electric devices are disclosed. in some example embodiments, the electric device includes a first thin substrate layer and a second thin substrate layer positioned above the first thin substrate layer. The electric device further includes one or more components electrically coupled to the first thin substrate layer. An overmold compound is deposited covering the one or more components between the first thin substrate and the second thin substrate. The electric device further includes one or more through mold vias that electrically and communicatively connect the first thin substrate layer and the second thin substrate layer.

Abstract: A method of forming a leadframe package, a leadframe package formed according to the method, and a system incorporating the leadframe package. The leadframe package includes: a metallization layer comprising a paddle portion and a contact portion including contact leads; a die mounted onto the paddle portion; wirebonds connected between the die and respective ones of the contact leads; an overmold encapsulating the die, the paddle portion, the contact leads and the wirebonds; and a stiffening element encapsulated in the overmold and unconnected to electrical pathways within the leadframe package.

Abstract: A method of forming a leadframe package, a leadframe package formed according to the method, and a system incorporating the leadframe package. The leadframe package includes: a metallization layer comprising a paddle portion and a contact portion including contact leads; a die mounted onto the paddle portion; wirebonds connected between the die and respective ones of the contact leads; an overmold encapsulating the die, the paddle portion, the contact leads and the wirebonds; and a stiffening element encapsulated in the overmold and unconnected to electrical pathways within the leadframe package.

Abstract: Methods of forming microelectronic devices by disposing a radiation curable underfill material or adhesive material between a substrate and a microelectronic die, and exposing any radiation curable material which bleeds-out therefrom to radiation before or immediately after disposition, thereby reducing the extent of material bleed-out.

Abstract: Method of forming microeletronic devices by disposing a radiation curable underfill material or adhesive material between a substrate and a microelectronic die, and exposing any the radiation curable material which bleeds-out therefrom to radiation before or immediately after disposition, thereby reducing the extent of material bleed-out.