Patents by Inventor Saeid TAHERION
Saeid TAHERION has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11701065Abstract: Various aspects include methods compensating for Compton scattering effects in pixel radiation detectors. Various aspects may include determining whether gamma ray detection events occurred in two or more detector pixels within an event frame, determining whether the gamma ray detection events occurred in detector pixels within a threshold distance of each other in response to determining that gamma ray detection events occurred in two or more detector pixels within the event frame, and recording the two or more gamma ray detection events as a single gamma ray detection event having an energy equal to the sum of measured energies of the two or more gamma ray detection events located in a detector pixel having a highest measured energy in response to determining that the gamma ray detection events occurred in detector pixels within the threshold distance of each other.Type: GrantFiled: May 15, 2020Date of Patent: July 18, 2023Assignee: REDLEN TECHNOLOGIES, INC.Inventors: Krzysztof Iniewski, Saeid Taherion, Glenn Bindley
-
Patent number: 11378701Abstract: A radiation sensor includes a radiation-sensitive semiconductor layer, a cathode electrode disposed over a front side of the radiation-sensitive semiconductor layer that is configured to be exposed to radiation, at least one anode electrode disposed over a backside of the radiation-sensitive semiconductor layer, and a potential barrier layer located between the cathode electrode and the front side of the radiation-sensitive semiconductor layer.Type: GrantFiled: October 6, 2020Date of Patent: July 5, 2022Assignee: REDLEN TECHNOLOGIES, INC.Inventors: Saeid Taherion, Michael K. Jackson
-
Patent number: 11372120Abstract: Various aspects include methods of compensating for issues caused by charge sharing between pixels in pixel radiation detectors. Various aspects may include measuring radiation energy spectra with circuitry capable of registering detection events occurring simultaneous or coincident in two or more pixels, adjusting energy measurements of simultaneous-multi-pixel detection events by a charge sharing correction factor, and determining a corrected energy spectrum by adding the adjusted energy measurements of simultaneous-multi-pixel detection events to energy spectra of detection events occurring in single pixels. Adjusting energy measurements of simultaneous-multi-pixel detection events may include multiplying measured energies of simultaneous-multi-pixel detection events by a factor of one plus the charge sharing correction factor.Type: GrantFiled: August 20, 2020Date of Patent: June 28, 2022Assignee: REDLEN TECHNOLOGIES, INC.Inventors: Krzysztof Iniewski, Saeid Taherion, Conny Hansson, Robert Crestani, Glenn Bindley
-
Publication number: 20220107431Abstract: A radiation sensor includes a radiation-sensitive semiconductor layer, a cathode electrode disposed over a front side of the radiation-sensitive semiconductor layer that is configured to be exposed to radiation, at least one anode electrode disposed over a backside of the radiation-sensitive semiconductor layer, and a potential barrier layer located between the cathode electrode and the front side of the radiation-sensitive semiconductor layer.Type: ApplicationFiled: October 6, 2020Publication date: April 7, 2022Inventors: Saeid TAHERION, Michael K. Jackson
-
Publication number: 20210063589Abstract: Various aspects include methods of compensating for issues caused by charge sharing between pixels in pixel radiation detectors. Various aspects may include measuring radiation energy spectra with circuitry capable of registering detection events occurring simultaneous or coincident in two or more pixels, adjusting energy measurements of simultaneous-multi-pixel detection events by a charge sharing correction factor, and determining a corrected energy spectrum by adding the adjusted energy measurements of simultaneous-multi-pixel detection events to energy spectra of detection events occurring in single pixels. Adjusting energy measurements of simultaneous-multi-pixel detection events may include multiplying measured energies of simultaneous-multi-pixel detection events by a factor of one plus the charge sharing correction factor.Type: ApplicationFiled: August 20, 2020Publication date: March 4, 2021Inventors: Krzysztof INIEWSKI, Saeid TAHERION, Conny HANSSON, Robert CRESTANI, Glenn BINDLEY
-
Publication number: 20200367839Abstract: Various aspects include methods compensating for Compton scattering effects in pixel radiation detectors. Various aspects may include determining whether gamma ray detection events occurred in two or more detector pixels within an event frame, determining whether the detection events occurred in detector pixels within a threshold distance of each other in response to determining that detection events occurred in two or more detector pixels within the event frame, and recording the two or more detection events as a single detection event having an energy equal to the sum of the measured energies of the two or more detection events located in the detector pixel having a highest measured energy in response to determining that the detection events occurred in detector pixels within the threshold distance of each other.Type: ApplicationFiled: May 15, 2020Publication date: November 26, 2020Inventors: Krzysztof INIEWSKI, Saeid TAHERION, Glenn BINDLEY
-
Publication number: 20200132866Abstract: Various embodiments include a structure that is configured to emit infrared (IR) light when exposed to ionizing radiation, such as X ray and gamma radiation, and to be positioned adjacent to a radiation detector so that infrared light illuminates the radiation detector when the structure and detector are exposed to the ionizing radiation. The structure may include a layer that is opaque to ultraviolet (UV) and visible light, another layer that is opaque to UV and visible light, and an intermediate layer that is configured to emit IR light when exposed to ionizing radiation. The intermediate layer may be a single layer. The intermediate layer may be two layers including a layer configured to emit UV or visible light when exposed to ionizing radiation and a layer configured to emit IR light when exposed to UV or visible light.Type: ApplicationFiled: October 21, 2019Publication date: April 30, 2020Inventors: Saeid Taherion, Georgios Prekas
-
Publication number: 20200116874Abstract: Various embodiments include an imaging system and methods of operating the system to reduce effects from space charge formation in radiation detectors. The imaging system includes a radiation detector configured to detect photon energy from ionizing radiation, a source of ionizing radiation configured to emit a beam of radiation toward the radiation detector, and a chopper disposed between the radiation detector and the source of ionizing radiation, wherein the chopper is configured to periodically block the beam of radiation from reaching the radiation detector. The chopper may be configured to limit delivery of photon energy to the radiation detector to durations shorter than an onset time of dynamic polarization and E-field relaxation. In some embodiments, the chopper is a rotating chopper rotated by a drive motor. In some embodiments, the chopper is a shutter.Type: ApplicationFiled: November 26, 2018Publication date: April 16, 2020Inventors: Georgios PREKAS, Saeid TAHERION
-
Patent number: 10276627Abstract: A method of fabricating a solid state radiation detector method includes mechanically lapping and polishing the first and the second surfaces of a semiconductor wafer using a plurality of lapping and polishing steps. The method also includes growing passivation oxide layers by use of oxygen plasma on the top of the polished first and second surfaces in order to passivate the semiconductor wafer. Anode contacts are deposited and patterned on top of the first passivation oxide layer, which is on top of the first surface. Cathode contacts, which are either monolithic or patterned, are deposited on top of the second passivation oxide layer, which is on the second surface. Aluminum nitride encapsulation layer can be deposited over the anode contacts and patterned to encapsulate the first passivation oxide layer, while physically exposing a center portion of each anode contact to electrically connect the anode contacts.Type: GrantFiled: October 10, 2017Date of Patent: April 30, 2019Assignee: REDLEN TECHNOLOGIES, INC.Inventors: Uri El-Hanany, Adam Densmore, Saeid Taherion, Georgios Prekas, Veeramani Perumal
-
Publication number: 20180033822Abstract: A method of fabricating a solid state radiation detector method includes mechanically lapping and polishing the first and the second surfaces of a semiconductor wafer using a plurality of lapping and polishing steps. The method also includes growing passivation oxide layers by use of oxygen plasma on the top of the polished first and second surfaces in order to passivate the semiconductor wafer. Anode contacts are deposited and patterned on top of the first passivation oxide layer, which is on top of the first surface. Cathode contacts, which are either monolithic or patterned, are deposited on top of the second passivation oxide layer, which is on the second surface. Aluminum nitride encapsulation layer can be deposited over the anode contacts and patterned to encapsulate the first passivation oxide layer, while physically exposing a center portion of each anode contact to electrically connect the anode contacts.Type: ApplicationFiled: October 10, 2017Publication date: February 1, 2018Inventors: Uri El-Hanany, Adam Densmore, Saeid Taherion, Georgios Prekas, Veeramani Perumal
-
Patent number: 9847369Abstract: A method of fabricating a solid state radiation detector method includes mechanically lapping and polishing the first and the second surfaces of a semiconductor wafer using a plurality of lapping and polishing steps. The method also includes growing passivation oxide layers by use of oxygen plasma on the top of the polished first and second surfaces in order to passivate the semiconductor wafer. Anode contacts are deposited and patterned on top of the first passivation oxide layer, which is on top of the first surface. Cathode contacts, which are either monolithic or patterned, are deposited on top of the second passivation oxide layer, which is on the second surface. Aluminum nitride encapsulation layer can be deposited over the anode contacts and patterned to encapsulate the first passivation oxide layer, while physically exposing a center portion of each anode contact to electrically connect the anode contacts.Type: GrantFiled: February 3, 2016Date of Patent: December 19, 2017Assignee: REDLEN TECHNOLOGIES, INC.Inventors: Uri El-Hanany, Adam Densmore, Saeid Taherion, Georgios Prekas, Veeramani Perumal
-
Publication number: 20160240584Abstract: A method of fabricating a solid state radiation detector method includes mechanically lapping and polishing the first and the second surfaces of a semiconductor wafer using a plurality of lapping and polishing steps. The method also includes growing passivation oxide layers by use of oxygen plasma on the top of the polished first and second surfaces in order to passivate the semiconductor wafer. Anode contacts are deposited and patterned on top of the first passivation oxide layer, which is on top of the first surface. Cathode contacts, which are either monolithic or patterned, are deposited on top of the second passivation oxide layer, which is on the second surface. Aluminum nitride encapsulation layer can be deposited over the anode contacts and patterned to encapsulate the first passivation oxide layer, while physically exposing a center portion of each anode contact to electrically connect the anode contacts.Type: ApplicationFiled: February 3, 2016Publication date: August 18, 2016Inventors: Uri EL-HANANY, Adam DENSMORE, Saeid TAHERION, Georgios PREKAS, Veeramani PERUMAL