Patents by Inventor Sae Mi HAN

Sae Mi HAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Display panel inspecting apparatus and display apparatus having the same
    Patent number: 11270610
    Abstract: A display panel inspecting apparatus includes a first inspecting transistor including a control electrode for receiving a first test gate signal, an input electrode for receiving a first voltage and an output electrode connected to an outermost data line disposed in an outermost area of a display region of a display panel, a second inspecting transistor including a control electrode for receiving the first test gate signal, an input electrode for receiving a second voltage and an output electrode connected to a normal data line disposed out of the outermost area of the display region, and a third inspecting transistor including a control electrode for receiving the first test gate signal, an input electrode for receiving a third voltage and an output electrode connected to a module crack inspecting data line disposed out of the outermost area of the display region.
    Type: Grant
    Filed: November 19, 2020
    Date of Patent: March 8, 2022
    Assignee: SAMSUNG DISPLAY CO., LTD.
    Inventors: Chan Wook Shim, Ji Ho Moon, In Cheol Song, Chang Gil Oh, Seong Keun Cho, Sae Mi Han
  • DISPLAY PANEL INSPECTING APPARATUS AND DISPLAY APPARATUS HAVING THE SAME
    Publication number: 20210225222
    Abstract: A display panel inspecting apparatus includes a first inspecting transistor including a control electrode for receiving a first test gate signal, an input electrode for receiving a first voltage and an output electrode connected to an outermost data line disposed in an outermost area of a display region of a display panel, a second inspecting transistor including a control electrode for receiving the first test gate signal, an input electrode for receiving a second voltage and an output electrode connected to a normal data line disposed out of the outermost area of the display region, and a third inspecting transistor including a control electrode for receiving the first test gate signal, an input electrode for receiving a third voltage and an output electrode connected to a module crack inspecting data line disposed out of the outermost area of the display region.
    Type: Application
    Filed: November 19, 2020
    Publication date: July 22, 2021
    Inventors: Chan Wook SHIM, Ji Ho MOON, In Cheol SONG, Chang Gil OH, Seong Keun CHO, Sae Mi HAN