Patents by Inventor Sagar BHOGELA

Sagar BHOGELA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methodology for testing integrated circuits
    Patent number: 9304163
    Abstract: An integrated circuit is disclosed. The integrated circuit includes input and output pads, a first integrated circuit portion having first circuitry, and a second integrated circuit portion having second circuitry different from the first circuitry. The first integrated circuit portion is configured to provide an input test signal from the input pad to the second integrated circuit portion, and provide an output test signal from the second integrated circuit portion to the output pad, the output test signal being generated by second integrated circuit portion in response to the input test signal.
    Type: Grant
    Filed: November 7, 2013
    Date of Patent: April 5, 2016
    Assignee: QUALCOMM Incorporated
    Inventors: Sagar Bhogela, Daisy Cynthia, Srikanth Srinivasan
  • METHODOLOGY FOR TESTING INTEGRATED CIRCUITS
    Publication number: 20150123696
    Abstract: An integrated circuit is disclosed. The integrated circuit includes input and output pads, a first integrated circuit portion having first circuitry, and a second integrated circuit portion having second circuitry different from the first circuitry. The first integrated circuit portion is configured to provide an input test signal from the input pad to the second integrated circuit portion, and provide an output test signal from the second integrated circuit portion to the output pad, the output test signal being generated by second integrated circuit portion in response to the input test signal.
    Type: Application
    Filed: November 7, 2013
    Publication date: May 7, 2015
    Applicant: Qualcomm Incorporated
    Inventors: Sagar BHOGELA, Daisy CYNTHIA, Srikanth SRINIVASAN