Patents by Inventor Sagar Panchal

Sagar Panchal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11938632
    Abstract: A method includes: compiling lower-resolution images, captured during a global scan cycle executed over a workpiece, into a virtual model; defining a nominal toolpath and a nominal target force for the workpiece based on a the virtual model; detecting a defect indicator on the workpiece based on the lower-resolution images; accessing a higher-resolution image captured during a local scan cycle over the defect indicator; characterizing the defect indicator as a defect reparable via material removal based on the higher-resolution image; defining a repair toolpath for the defect based on the virtual model; navigating a sanding head over the workpiece according to the repair toolpath to repair the defect; and, during a processing cycle: navigating the sanding head across the workpiece according to the nominal toolpath and deviating the sanding head from the nominal toolpath to maintain forces of the sanding head on the workpiece proximal the nominal target force.
    Type: Grant
    Filed: May 2, 2023
    Date of Patent: March 26, 2024
    Assignee: GrayMatter Robotics Inc.
    Inventors: Avadhoot Ahire, YiWei Chen, Rishav Guha, Satyandra K. Gupta, Ariyan M. Kabir, Ashish Kulkarni, Caesar Navarro, Sagar Panchal, Brual C. Shah
  • Publication number: 20240033915
    Abstract: A method includes: compiling lower-resolution images, captured during a global scan cycle executed over a workpiece, into a virtual model; defining a nominal toolpath and a nominal target force for the workpiece based on a the virtual model; detecting a defect indicator on the workpiece based on the lower-resolution images; accessing a higher-resolution image captured during a local scan cycle over the defect indicator; characterizing the defect indicator as a defect reparable via material removal based on the higher-resolution image; defining a repair toolpath for the defect based on the virtual model; navigating a sanding head over the workpiece according to the repair toolpath to repair the defect; and, during a processing cycle: navigating the sanding head across the workpiece according to the nominal toolpath and deviating the sanding head from the nominal toolpath to maintain forces of the sanding head on the workpiece proximal the nominal target force.
    Type: Application
    Filed: October 11, 2023
    Publication date: February 1, 2024
    Inventors: Avadhoot Ahire, YiWei Chen, Rishav Guha, Satyandra K. Gupta, Ariyan M. Kabir, Ashish Kulkarni, Ceasar Navarro, Sagar Panchal, Brual C. Shah
  • Publication number: 20240033914
    Abstract: One variation of a method includes: accessing a maximum deflection distance of a workpiece; defining a first workpiece region characterized by a first compliance range; defining a second workpiece region characterized by a second compliance range greater than the first compliance range; assigning a nominal target force to the workpiece; navigating a sanding head across the first workpiece region during a processing cycle; driving the sanding head below a virtual unloaded surface of the workpiece stored in the virtual model to maintain forces, of the sanding head on the first workpiece region, approximating the nominal target force; calculating a maximum offset between the positions of the sanding head in the first workpiece region and the virtual unloaded surface; and, in response to the first maximum offset approaching the maximum deflection distance, assigning a lower target force to the second workpiece region of the workpiece.
    Type: Application
    Filed: October 11, 2023
    Publication date: February 1, 2024
    Inventors: Avadhoot Ahire, Cheng Gong, Rishav Guha, Satyandra K. Gupta, Ariyan M. Kabir, Vihan Krishnan, Sagar Panchal, Brual C. Shah
  • Patent number: 11820016
    Abstract: One variation of a method includes: accessing a maximum deflection distance of a workpiece; defining a first workpiece region characterized by a first compliance range; defining a second workpiece region characterized by a second compliance range greater than the first compliance range; assigning a nominal target force to the workpiece; navigating a sanding head across the first workpiece region during a processing cycle; driving the sanding head below a virtual unloaded surface of the workpiece stored in the virtual model to maintain forces, of the sanding head on the first workpiece region, approximating the nominal target force; calculating a maximum offset between the positions of the sanding head in the first workpiece region and the virtual unloaded surface; and, in response to the first maximum offset approaching the maximum deflection distance, assigning a lower target force to the second workpiece region of the workpiece.
    Type: Grant
    Filed: March 27, 2023
    Date of Patent: November 21, 2023
    Assignee: GrayMatter Robotics Inc.
    Inventors: Avadhoot Ahire, Cheng Gong, Rishav Guha, Satyandra K. Gupta, Ariyan M. Kabir, Vihan Krishnan, Sagar Panchal, Brual C. Shah
  • Publication number: 20230302640
    Abstract: One variation of a method includes: accessing a maximum deflection distance of a workpiece; defining a first workpiece region characterized by a first compliance range; defining a second workpiece region characterized by a second compliance range greater than the first compliance range; assigning a nominal target force to the workpiece; navigating a sanding head across the first workpiece region during a processing cycle; driving the sanding head below a virtual unloaded surface of the workpiece stored in the virtual model to maintain forces, of the sanding head on the first workpiece region, approximating the nominal target force; calculating a maximum offset between the positions of the sanding head in the first workpiece region and the virtual unloaded surface; and, in response to the first maximum offset approaching the maximum deflection distance, assigning a lower target force to the second workpiece region of the workpiece.
    Type: Application
    Filed: March 27, 2023
    Publication date: September 28, 2023
    Inventors: Avadhoot Ahire, Cheng Gong, Rishav Guha, Satyandra K. Gupta, Ariyan M. Kabir, Vihan Krishnan, Sagar Panchal, Brual C. Shah
  • Publication number: 20230302641
    Abstract: A method includes: compiling lower-resolution images, captured during a global scan cycle executed over a workpiece, into a virtual model; defining a nominal toolpath and a nominal target force for the workpiece based on a the virtual model; detecting a defect indicator on the workpiece based on the lower-resolution images; accessing a higher-resolution image captured during a local scan cycle over the defect indicator; characterizing the defect indicator as a defect reparable via material removal based on the higher-resolution image; defining a repair toolpath for the defect based on the virtual model; navigating a sanding head over the workpiece according to the repair toolpath to repair the defect; and, during a processing cycle: navigating the sanding head across the workpiece according to the nominal toolpath and deviating the sanding head from the nominal toolpath to maintain forces of the sanding head on the workpiece proximal the nominal target force.
    Type: Application
    Filed: May 2, 2023
    Publication date: September 28, 2023
    Inventors: Avadhoot Ahire, YiWei Chen, Rishav Guha, Satyandra K. Gupta, Ariyan M. Kabir, Ashish Kulkarni, JR., Caesar Navarro, Sagar Panchal, Brual C. Shah