Patents by Inventor Sai MarapaReddy

Sai MarapaReddy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11948347
    Abstract: A method and a system are presented for controlling a performance of a fusion model. The method includes obtaining a first set and a second set of candidate models for a first and second neural networks, respectively. Each of the first and second set of candidate models is pre-trained with a first source and a second source, respectively. For each possible pairing of one candidate model from the first neural network and one candidate model from the second neural network, a model distance Dm is determined. A subset of possible pairings of one first candidate model and one second candidate model is selected based on the model distance Dm between them. Using the subset of possible parings, the first neural network and the second neural network are combined to generate two branches for a fusion model neural network.
    Type: Grant
    Filed: July 24, 2020
    Date of Patent: April 2, 2024
    Assignee: Samsung Display Co., Ltd.
    Inventors: Shuhui Qu, Janghwan Lee, Yan Kang, Jinghua Yao, Sai MarapaReddy
  • Publication number: 20230316493
    Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.
    Type: Application
    Filed: May 19, 2023
    Publication date: October 5, 2023
    Inventors: Yan Kang, Janghwan Lee, Shuhui Qu, Jinghua Yao, Sai MarapaReddy
  • Patent number: 11694319
    Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.
    Type: Grant
    Filed: July 24, 2020
    Date of Patent: July 4, 2023
    Assignee: Samsung Display Co., Ltd.
    Inventors: Yan Kang, Janghwan Lee, Shuhui Qu, Jinghua Yao, Sai MarapaReddy
  • Patent number: 11435719
    Abstract: A system and method for classifying products manufactured via a manufacturing process. A processor receives an input dataset, and extracts features of the input dataset at two or more levels of abstraction. The processor combines the extracted features and provides the combined extracted features to a classifier. The classifier is trained based on the combined extracted features for learning a pattern of not-faulty products. The trained classifier is configured to receive data for a product to be classified, to output a prediction for the product based on the received data.
    Type: Grant
    Filed: November 22, 2019
    Date of Patent: September 6, 2022
    Assignee: Samsung Display Co., Ltd.
    Inventors: Sai MarapaReddy, Shuhui Qu, Janghwan Lee
  • Publication number: 20210319546
    Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.
    Type: Application
    Filed: July 24, 2020
    Publication date: October 14, 2021
    Inventors: Yan Kang, Janghwan Lee, Shuhui Qu, Jinghua Yao, Sai MarapaReddy
  • Publication number: 20210319270
    Abstract: A method and a system are presented for controlling a performance of a fusion model. The method includes obtaining a first set and a second set of candidate models for a first and second neural networks, respectively. Each of the first and second set of candidate models is pre-trained with a first source and a second source, respectively. For each possible pairing of one candidate model from the first neural network and one candidate model from the second neural network, a model distance Dm is determined. A subset of possible pairings of one first candidate model and one second candidate model is selected based on the model distance Dm between them. Using the subset of possible parings, the first neural network and the second neural network are combined to generate two branches for a fusion model neural network.
    Type: Application
    Filed: July 24, 2020
    Publication date: October 14, 2021
    Inventors: Shuhui Qu, Janghwan Lee, Yan Kang, Jinghua Yao, Sai MarapaReddy
  • Publication number: 20210096530
    Abstract: A system and method for classifying products manufactured via a manufacturing process. A processor receives an input dataset, and extracts features of the input dataset at two or more levels of abstraction. The processor combines the extracted features and provides the combined extracted features to a classifier. The classifier is trained based on the combined extracted features for learning a pattern of not-faulty products. The trained classifier is configured to receive data for a product to be classified, to output a prediction for the product based on the received data.
    Type: Application
    Filed: November 22, 2019
    Publication date: April 1, 2021
    Inventors: Sai MarapaReddy, Shuhui Qu, Janghwan Lee