Patents by Inventor Saint-Chi WANG

Saint-Chi WANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Baseline predictive maintenance method for target device and computer program product thereof
    Patent number: 10242319
    Abstract: A baseline predictive maintenance method for a target device (TD) and a computer program product thereof are provided. Fresh samples which are generated when the target device produces workpieces just after maintenance are collected, and a new workpiece sample which is generated when the target device produces a new workpiece is collected. A plurality of modeling samples are used to build a TD baseline model in accordance with a conjecturing algorithm, wherein the modeling samples include the new workpiece sample and the fresh samples. A TD healthy baseline value for the new workpiece is computed by the TD baseline model, and a device health index (DHI), a baseline error index (BEI) and baseline individual similarity indices (ISIB) are computed, thereby achieving the goals of fault detection and classification (FDC) and predictive maintenance (PdM).
    Type: Grant
    Filed: March 18, 2013
    Date of Patent: March 26, 2019
    Assignee: NATIONAL CHENG KUNG UNIVERSITY
    Inventors: Fan-Tien Cheng, Yao-Sheng Hsieh, Chung-Ren Wang, Saint-Chi Wang
  • BASELINE PREDICTIVE MAINTENANCE METHOD FOR TARGET DEVICE AND COMPUTER PROGRAM PRODUCT THEREOF
    Publication number: 20140025315
    Abstract: A baseline predictive maintenance method for a target device (TD) and a computer program product thereof are provided. Fresh samples which are generated when the target device produces workpieces just after maintenance are collected, and a new workpiece sample which is generated when the target device produces a new workpiece is collected. A plurality of modeling samples are used to build a TD baseline model in accordance with a conjecturing algorithm, wherein the modeling samples include the new workpiece sample and the fresh samples. A TD healthy baseline value for the new workpiece is computed by the TD baseline model, and a device health index (DHI), a baseline error index (BEI) and baseline individual similarity indices (ISIB) are computed, thereby achieving the goals of fault detection and classification (FDC) and predictive maintenance (PdM).
    Type: Application
    Filed: March 18, 2013
    Publication date: January 23, 2014
    Applicant: NATIONAL CHENG KUNG UNIVERSITY
    Inventors: Fan-Tien CHENG, Yao-Sheng HSIEH, Chung-Ren WANG, Saint-Chi WANG