Abstract: An integrated circuit (IC), including: a current mirror, including: a first field effect transistor (FET) including a first drain, a first gate, and a first source, wherein the first source is coupled to a first voltage rail; and a second FET including a second drain, a second gate, and a second source, wherein the second gate is coupled to the first gate of the first FET, and the second source is coupled to the first voltage rail; and a selective coupling circuit configured to selectively couple the first drain of the first FET to the first and second gates of the first and second FETs based on a voltage at the first drain of the first FET.

Abstract: An integrated circuit (IC), including: a current mirror, including: a first field effect transistor (FET) including a first drain, a first gate, and a first source, wherein the first source is coupled to a first voltage rail; and a second FET including a second drain, a second gate, and a second source, wherein the second gate is coupled to the first gate of the first FET, and the second source is coupled to the first voltage rail; and a selective coupling circuit configured to selectively couple the first drain of the first FET to the first and second gates of the first and second FETs based on a voltage at the first drain of the first FET.

Abstract: An integrated circuit (IC), including: a current mirror, including: a first field effect transistor (FET) including a first drain, a first gate, and a first source, wherein the first source is coupled to a first voltage rail; and a second FET including a second drain, a second gate, and a second source, wherein the second gate is coupled to the first gate of the first FET, and the second source is coupled to the first voltage rail; and a selective coupling circuit configured to selectively couple the first drain of the first FET to the first and second gates of the first and second FETs based on a voltage at the first drain of the first FET.

Abstract: A MOS device includes a set of pMOS transistors on a first side of an IC. The set of pMOS transistors is adjacent to each other in a second direction. The MOS device further includes a set of nMOS transistors on a second side of the IC. The set of nMOS transistors is adjacent to each other in the second direction. The second side is opposite the first side in a first direction orthogonal to the second direction. The MOS device further includes an OD region between the set of pMOS transistors and the set of nMOS transistors. A first set of gate interconnects may extend in the first direction over the OD region. A set of contacts may contact the OD region. The OD region, the first set of gate interconnects, and the set of contacts may form a set of transistors configured as dummy transistors or decoupling capacitors.

Abstract: A bandwidth enhanced amplifier for high frequency CML To CMOS conversion is disclosed. In some implementations, an improved CML to CMOS converter includes a differential amplifier having a first and a second input transistors, and a first and a second load transistors. The first input transistor is coupled in series with the first load transistor, and the second input transistor is coupled in series with the second load transistor. The improved CML to CMOS converter further includes a first capacitor and a second capacitor. The first capacitor is coupled directly between a gate of the first input transistor and a gate of the first load transistor.

Abstract: Certain aspects of the present disclosure generally relate to a sampling circuit, such as a sampling circuit for a low-voltage differential signaling (LVDS) serializer/deserializer (SerDes) system. One example sampling circuit generally includes a latching circuit and a plurality of pass-gate transistors. The latching circuit includes differential inputs, differential outputs, a clocked input circuit coupled to the differential inputs, a first cross-coupled circuit coupled to the clocked input circuit, and a second cross-coupled circuit coupled to the first cross-coupled circuit, wherein the first and second cross-coupled circuits are coupled to the differential outputs of the latching circuit. Each pass-gate transistor is coupled between one of the differential inputs of the latching circuit and a corresponding differential input of the sampling circuit.

Abstract: An IC includes an array of cells and a first set of endcap cells. The array of cells includes a first set of Mx layer power interconnects coupled to a first voltage, a first set of Mx layer interconnects, a second set of Mx layer power interconnects coupled to a second voltage source, and a second set of Mx layer interconnects. The first set of endcap cells includes first and second sets of Mx+1 layer interconnects. The first set of Mx+1 layer interconnects is coupled to the first set of Mx layer power interconnects and to the second set of Mx layer interconnects to provide a first set of decoupling capacitors. The second set of Mx+1 layer interconnects is coupled to the second set of Mx layer power interconnects and to the first set of Mx layer interconnects to provide a second set of decoupling capacitors.

Abstract: Systems and methods for dividing input clock signals by programmable divide ratios can produce output clock signals with the delay from the input clock signal to the output clock signal independent of the value of the divide ratio and with the duty cycle of the output clock signal being 50% independent of the value of the divide ratio. An example programmable clock divider includes a modulo N counter that produces a count signal that counts modulo the divide ratio and a half-rate clock signal generator that produces a common half-rate clock signal, an even half-rate clock signal, and an odd half-rate clock signal that toggle at one-half the rate of the output clock signal. The common half-rate clock signal, the even half-rate clock signal, and the odd half-rate clock signal are combined to produce the output clock signal.

Abstract: Systems and methods for dividing input clock signals by programmable divide ratios can produce output clock signals with the delay from the input clock signal to the output clock signal independent of the value of the divide ratio and with the duty cycle of the output clock signal being 50% independent of the value of the divide ratio. An example programmable clock divider includes a modulo N counter that produces a count signal that counts modulo the divide ratio and a half-rate clock signal generator that produces a common half-rate clock signal, an even half-rate clock signal, and an odd half-rate clock signal that toggle at one-half the rate of the output clock signal. The common half-rate clock signal, the even half-rate clock signal, and the odd half-rate clock signal are combined to produce the output clock signal.