Patents by Inventor Saki Itzhak Hakim

Saki Itzhak Hakim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multiple optical input inspection system
    Patent number: 7925073
    Abstract: A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by employing the other image so as to produce an enhanced representation of the electrical circuit, and inspecting the enhanced representation for defects.
    Type: Grant
    Filed: May 15, 2007
    Date of Patent: April 12, 2011
    Assignee: Orbotech Ltd.
    Inventors: Saki Itzhak Hakim, Zeev Smilansky
  • Multiple optical input inspection system
    Patent number: 7231080
    Abstract: A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by employing the other image so as to produce an enhanced representation of the electrical circuit, and inspecting the enhanced representation for defects.
    Type: Grant
    Filed: February 13, 2001
    Date of Patent: June 12, 2007
    Assignee: Orbotech Ltd.
    Inventors: Saki Itzhak Hakim, Zeev Smilansky
  • Multiple optical input inspection system
    Publication number: 20020154810
    Abstract: A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by employing the other image so as to produce an enhanced representation of the electrical circuit, and inspecting the enhanced representation for defects.
    Type: Application
    Filed: February 13, 2001
    Publication date: October 24, 2002
    Applicant: ORBOTECH LTD.
    Inventors: Saki Itzhak Hakim, Zeev Smilansky