Patents by Inventor Sakiko SHIMIZU

Sakiko SHIMIZU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10553314
    Abstract: A biological clock time calculating apparatus includes: a measuring portion which measures bio-information that changes on a daily basis; and an arithmetic processing portion which calculates biological clock time based on a measurement result of the measuring portion. A biological clock time calculating method may be configured to include: measuring bio-information which changes on a daily basis; and calculating biological clock time based on the measurement result.
    Type: Grant
    Filed: July 28, 2017
    Date of Patent: February 4, 2020
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Akira Ikeda, Sakiko Shimizu, Ayae Sawado, Hiroyuki Masuda
  • Patent number: 10413680
    Abstract: A needle assembly includes: a needle comprising a hollow needle tube, a needle tip at a distal end of the hollow needle tube, and a cutting face disposed adjacent to the needle tip; and a needle hub that includes a tip and a base end, and holds the needle at the needle tip. The needle hub includes a needle tip side end face from which the needle tip projects. An outer diameter of the needle is within a range of 0.15 mm to 0.20 mm, inclusive. A projection needle length extending from the needle tip side end face to the needle tip is within a range of 0.50 mm to 1.25 mm, inclusive. A needle body length extending from the needle tip side end face to a proximal end of the cutting face in within a range of 0.10 mm to 0.70 mm, inclusive.
    Type: Grant
    Filed: July 19, 2017
    Date of Patent: September 17, 2019
    Assignee: TERUMO KABUSHIKI KAISHA
    Inventors: Sakiko Shimizu, Sayaka Omori, Kazunori Koiwai, Yoichiro Iwase
  • Patent number: 10260965
    Abstract: A heat flow sensor includes a heat transfer layer that has first and second surfaces confronting each other and has flexibility and a temperature difference measurement unit that measures a temperature difference between the first and second surfaces of the heat transfer layer. The heat transfer layer includes a first member having flexibility and a second member with higher thermal conductivity than the first member. The thickness of the heat transfer layer is equal to or greater than 0.5 mm, thermal conductivity of the heat transfer layer is equal to or greater than 10 W/(m×K), and Shore hardness of the heat transfer layer is equal to or less than A50.
    Type: Grant
    Filed: February 25, 2016
    Date of Patent: April 16, 2019
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Akira Ikeda, Sakiko Shimizu
  • Patent number: 10209209
    Abstract: An internal temperature measuring device is configured to include an acquisition unit that acquires a one side temperature and a one side heat flux of a measurement target on a one side surface side and an opposite side temperature and an opposite side heat flux of the measurement target on an opposite side surface side; and a computation unit that computes an internal temperature of the measurement target by applying the one side temperature, the one side heat flux, the opposite side temperature, and the opposite side heat flux.
    Type: Grant
    Filed: December 22, 2016
    Date of Patent: February 19, 2019
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Akira Ikeda, Sakiko Shimizu, Kazuhiro Nishida
  • Publication number: 20180136275
    Abstract: A temperature-measuring apparatus includes a heat source capable of changing a heat generation temperature, a temperature sensor that detects a temperature of a predetermined position other than a measurement target accommodated in a measurement subject, and a temperature computation portion that computes a temperature of the measurement target on the basis of heat balance characteristics of the temperature of the measurement target, a temperature of the heat source, and the temperature of the predetermined position, the temperature of the heat source, and the detected temperature of the predetermined position.
    Type: Application
    Filed: October 31, 2017
    Publication date: May 17, 2018
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Sakiko SHIMIZU, Akira IKEDA
  • Publication number: 20180136276
    Abstract: A temperature-measuring apparatus includes a first heat source capable of changing a heat generation temperature, a mounting portion on which a measurement subject accommodating a measurement target is mounted, a second heat source which is a heat source that heats the mounting portion and is capable of changing a heat generation temperature, a temperature sensor that detects a temperature of a predetermined position other than the measurement target on a heat flow path which comes from the first heat source and passes through the measurement subject, and a temperature computation portion that computes a temperature of the measurement target on the basis of heat balance characteristics of the temperature of the measurement target, a temperatures of the first heat source, a temperature of the second heat source, and the temperature of the predetermined position, the temperatures of the first heat source, the temperature of the second heat source, and the detected temperature of the predetermined position.
    Type: Application
    Filed: October 31, 2017
    Publication date: May 17, 2018
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Sakiko SHIMIZU, Akira IKEDA
  • Patent number: 9952105
    Abstract: A temperature measurement apparatus includes a first temperature sensor disposed so as to be close to a contact surface with an object to be measured in a thickness direction of an apparatus main body, and a second temperature sensor disposed so as to be close to a display unit in the thickness direction of the apparatus main body. The display unit is switched between a first display state and a second display state by switching a mark between display and non-display. An internal temperature of the object to be measured is calculated by using a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the first display state, and a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the second display state.
    Type: Grant
    Filed: March 4, 2016
    Date of Patent: April 24, 2018
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Sakiko Shimizu, Akira Ikeda
  • Publication number: 20180039749
    Abstract: A biological clock time calculating apparatus includes: a measuring portion which measures bio-information that changes on a daily basis; and an arithmetic processing portion which calculates biological clock time based on a measurement result of the measuring portion. A biological clock time calculating method may be configured to include: measuring bio-information which changes on a daily basis; and calculating biological clock time based on the measurement result.
    Type: Application
    Filed: July 28, 2017
    Publication date: February 8, 2018
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira IKEDA, Sakiko SHIMIZU, Ayae SAWADO, Hiroyuki MASUDA
  • Publication number: 20170312453
    Abstract: A needle assembly includes: a needle comprising a hollow needle tube, a needle tip at a distal end of the hollow needle tube, and a cutting face disposed adjacent to the needle tip; and a needle hub that includes a tip and a base end, and holds the needle at the needle tip. The needle hub includes a needle tip side end face from which the needle tip projects. An outer diameter of the needle is within a range of 0.15 mm to 0.20 mm, inclusive. A projection needle length extending from the needle tip side end face to the needle tip is within a range of 0.50 mm to 1.25 mm, inclusive. A needle body length extending from the needle tip side end face to a proximal end of the cutting face in within a range of 0.10 mm to 0.70 mm, inclusive.
    Type: Application
    Filed: July 19, 2017
    Publication date: November 2, 2017
    Applicant: TERUMO KABUSHIKI KAISHA
    Inventors: Sakiko SHIMIZU, Sayaka OMORI, Kazunori KOIWAI, Yoichiro IWASE
  • Publication number: 20170184523
    Abstract: An internal temperature measuring device is configured to include an acquisition unit that acquires a one side temperature and a one side heat flux of a measurement target on a one side surface side and an opposite side temperature and an opposite side heat flux of the measurement target on an opposite side surface side; and a computation unit that computes an internal temperature of the measurement target by applying the one side temperature, the one side heat flux, the opposite side temperature, and the opposite side heat flux.
    Type: Application
    Filed: December 22, 2016
    Publication date: June 29, 2017
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira IKEDA, Sakiko SHIMIZU, Kazuhiro NISHIDA
  • Patent number: 9528887
    Abstract: A temperature measurement device includes a temperature measurement part, a calculation part, and a control part for controlling the operation of the temperature measurement part and the calculation part. The temperature measurement part has a substrate having a first surface as a contact surface with a measured body, and a second surface as an environment-lateral surface which is opposite the first surface, a first temperature sensor, a second temperature sensor, and a third temperature sensor, and the first temperature sensor. The second temperature sensor, and the third temperature sensor measure a first temperature, a second temperature, and a third temperature a plurality of times under conditions in which the temperature of the environment varies, and the calculation part calculates a deep temperature in a deep part of the measured body by using the measured temperatures.
    Type: Grant
    Filed: October 11, 2011
    Date of Patent: December 27, 2016
    Assignee: Seiko Epson Corporation
    Inventor: Sakiko Shimizu
  • Publication number: 20160258823
    Abstract: A temperature measurement apparatus includes a first temperature sensor disposed so as to be close to a contact surface with an object to be measured in a thickness direction of an apparatus main body, and a second temperature sensor disposed so as to be close to a display unit in the thickness direction of the apparatus main body. The display unit is switched between a first display state and a second display state by switching a mark between display and non-display. An internal temperature of the object to be measured is calculated by using a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the first display state, and a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the second display state.
    Type: Application
    Filed: March 4, 2016
    Publication date: September 8, 2016
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Sakiko SHIMIZU, Akira IKEDA
  • Publication number: 20160252407
    Abstract: A heat flow sensor includes a heat transfer layer that has first and second surfaces confronting each other and has flexibility and a temperature difference measurement unit that measure's a temperature difference between the first and second surfaces of the heat transfer layer. The heat transfer layer includes a first member having flexibility and a second member with higher thermal conductivity than the first member. The thickness of the heat transfer layer is equal to or greater than 0.5 mm, thermal conductivity of the heat transfer layer is equal to or greater than 10 W/(m×K), and Shore hardness of the heat transfer layer is equal to or less than A50.
    Type: Application
    Filed: February 25, 2016
    Publication date: September 1, 2016
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira IKEDA, Sakiko SHIMIZU
  • Publication number: 20160097712
    Abstract: A signal detection method includes acquiring a measurement signal including a first signal, which is a signal of a target component, and a second signal, which is a signal of an interference component; and performing an orthogonal operation for adjusting the measurement signal such that the measurement signal is orthogonal to the second signal.
    Type: Application
    Filed: October 2, 2015
    Publication date: April 7, 2016
    Inventors: Sakiko SHIMIZU, Kazuhiro NISHIDA
  • Publication number: 20160069752
    Abstract: A temperature measurement apparatus includes a first temperature sensor and a second temperature sensor which are provided at different positions inside a base which is in contact with a surface of a body to be measured, and a calculation processing unit which calculates a temperature of a measurement target position of the body to be measured using respective detected temperatures in the first and second temperature sensors. The calculation processing unit calculates a temperature of the measurement target position of the body to be measured using a heat balance relative coefficient indicating a relative relationship between heat balance characteristics at the respective positions of the first temperature sensor and the second temperature sensor when the base is in contact with the measurement target position and the surface of the body to be measured, and the respective detected temperatures in the first temperature sensor and the second temperature sensor.
    Type: Application
    Filed: September 10, 2015
    Publication date: March 10, 2016
    Inventor: Sakiko SHIMIZU
  • Patent number: 9068898
    Abstract: A thermometer includes first and second surface temperature measurement units, first and second reference temperature measurement units, a storage unit, a temperature correction unit, and a temperature calculation unit. The first reference temperature measurement unit measures a temperature at an opposite side of the first surface temperature measurement unit as a first reference temperature through a first heat insulating portion having a first thermal resistance value. The second reference temperature measurement unit measures a temperature at an opposite side of the second surface temperature measurement unit as a second reference temperature through a second heat insulating portion having a second thermal resistance value. The temperature correction unit corrects the first surface temperature and the first reference temperature based on the second surface temperature and the second reference temperature.
    Type: Grant
    Filed: April 30, 2014
    Date of Patent: June 30, 2015
    Assignee: Seiko Epson Corporation
    Inventor: Sakiko Shimizu
  • Patent number: 9015001
    Abstract: A temperature measurement device includes a temperature measurement part, a calculation part, and a control part for controlling the operation of the temperature measurement part and the calculation part; wherein the temperature measurement part has a substrate having a first surface as a contact surface with a measured body, and a second surface as an environment-side surface which is opposite the first surface; a first temperature sensor; a second temperature sensor; and an environment temperature acquiring part; and the first temperature sensor and the second temperature sensor measure a first temperature and a second temperature a plurality of times under conditions in which a third temperature varies; and the calculation part calculates a deep temperature in a deep part of the measured body, on the basis of a deep temperature calculation equation, by using the measured temperatures.
    Type: Grant
    Filed: September 9, 2011
    Date of Patent: April 21, 2015
    Assignee: Seiko Epson Corporation
    Inventor: Sakiko Shimizu
  • Publication number: 20140343887
    Abstract: A temperature measurement device includes a temperature measurement part, a heat insulator, and a calculation part. The temperature measurement part is disposed among the heat insulator and has a substrate as a heating medium having a first surface as a contact surface configured to contact a measured body, a first temperature sensor configured to measure, as a first temperature, the temperature at a first measurement point of the substrate, and a second temperature sensor for measuring, as a second temperature, the temperature at a second measurement point different from the first measurement point of the substrate. The first measurement point and the second measurement point are positioned on an external surface of the substrate or inside of the substrate. The calculation part calculates a deep temperature in a deep part of the measured body distant from the first surface on the basis of the first temperature and the second temperature.
    Type: Application
    Filed: August 5, 2014
    Publication date: November 20, 2014
    Inventor: Sakiko SHIMIZU
  • Publication number: 20140278201
    Abstract: A temperature measurement device 100 includes: a first temperature sensor 11 and a second temperature sensor 12 that are provided at different positions in a base portion 100 that is in contact with a measurement subject; and a computation processing unit 300 configured to calculate a temperature of the measurement subject by using temperatures detected by the first temperature sensor 11 and the second temperature sensor 12.
    Type: Application
    Filed: March 10, 2014
    Publication date: September 18, 2014
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Sakiko SHIMIZU
  • Publication number: 20140233604
    Abstract: A thermometer includes first and second surface temperature measurement units, first and second reference temperature measurement units, a storage unit, a temperature correction unit, and a temperature calculation unit. The first reference temperature measurement unit measures a temperature at an opposite side of the first surface temperature measurement unit as a first reference temperature through a first heat insulating portion having a first thermal resistance value. The second reference temperature measurement unit measures a temperature at an opposite side of the second surface temperature measurement unit as a second reference temperature through a second heat insulating portion having a second thermal resistance value. The temperature correction unit corrects the first surface temperature and the first reference temperature based on the second surface temperature and the second reference temperature.
    Type: Application
    Filed: April 30, 2014
    Publication date: August 21, 2014
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Sakiko SHIMIZU