Patents by Inventor Sakiko SHIMIZU
Sakiko SHIMIZU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10553314Abstract: A biological clock time calculating apparatus includes: a measuring portion which measures bio-information that changes on a daily basis; and an arithmetic processing portion which calculates biological clock time based on a measurement result of the measuring portion. A biological clock time calculating method may be configured to include: measuring bio-information which changes on a daily basis; and calculating biological clock time based on the measurement result.Type: GrantFiled: July 28, 2017Date of Patent: February 4, 2020Assignee: SEIKO EPSON CORPORATIONInventors: Akira Ikeda, Sakiko Shimizu, Ayae Sawado, Hiroyuki Masuda
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Patent number: 10413680Abstract: A needle assembly includes: a needle comprising a hollow needle tube, a needle tip at a distal end of the hollow needle tube, and a cutting face disposed adjacent to the needle tip; and a needle hub that includes a tip and a base end, and holds the needle at the needle tip. The needle hub includes a needle tip side end face from which the needle tip projects. An outer diameter of the needle is within a range of 0.15 mm to 0.20 mm, inclusive. A projection needle length extending from the needle tip side end face to the needle tip is within a range of 0.50 mm to 1.25 mm, inclusive. A needle body length extending from the needle tip side end face to a proximal end of the cutting face in within a range of 0.10 mm to 0.70 mm, inclusive.Type: GrantFiled: July 19, 2017Date of Patent: September 17, 2019Assignee: TERUMO KABUSHIKI KAISHAInventors: Sakiko Shimizu, Sayaka Omori, Kazunori Koiwai, Yoichiro Iwase
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Patent number: 10260965Abstract: A heat flow sensor includes a heat transfer layer that has first and second surfaces confronting each other and has flexibility and a temperature difference measurement unit that measures a temperature difference between the first and second surfaces of the heat transfer layer. The heat transfer layer includes a first member having flexibility and a second member with higher thermal conductivity than the first member. The thickness of the heat transfer layer is equal to or greater than 0.5 mm, thermal conductivity of the heat transfer layer is equal to or greater than 10 W/(m×K), and Shore hardness of the heat transfer layer is equal to or less than A50.Type: GrantFiled: February 25, 2016Date of Patent: April 16, 2019Assignee: SEIKO EPSON CORPORATIONInventors: Akira Ikeda, Sakiko Shimizu
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Patent number: 10209209Abstract: An internal temperature measuring device is configured to include an acquisition unit that acquires a one side temperature and a one side heat flux of a measurement target on a one side surface side and an opposite side temperature and an opposite side heat flux of the measurement target on an opposite side surface side; and a computation unit that computes an internal temperature of the measurement target by applying the one side temperature, the one side heat flux, the opposite side temperature, and the opposite side heat flux.Type: GrantFiled: December 22, 2016Date of Patent: February 19, 2019Assignee: SEIKO EPSON CORPORATIONInventors: Akira Ikeda, Sakiko Shimizu, Kazuhiro Nishida
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Publication number: 20180136275Abstract: A temperature-measuring apparatus includes a heat source capable of changing a heat generation temperature, a temperature sensor that detects a temperature of a predetermined position other than a measurement target accommodated in a measurement subject, and a temperature computation portion that computes a temperature of the measurement target on the basis of heat balance characteristics of the temperature of the measurement target, a temperature of the heat source, and the temperature of the predetermined position, the temperature of the heat source, and the detected temperature of the predetermined position.Type: ApplicationFiled: October 31, 2017Publication date: May 17, 2018Applicant: SEIKO EPSON CORPORATIONInventors: Sakiko SHIMIZU, Akira IKEDA
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Publication number: 20180136276Abstract: A temperature-measuring apparatus includes a first heat source capable of changing a heat generation temperature, a mounting portion on which a measurement subject accommodating a measurement target is mounted, a second heat source which is a heat source that heats the mounting portion and is capable of changing a heat generation temperature, a temperature sensor that detects a temperature of a predetermined position other than the measurement target on a heat flow path which comes from the first heat source and passes through the measurement subject, and a temperature computation portion that computes a temperature of the measurement target on the basis of heat balance characteristics of the temperature of the measurement target, a temperatures of the first heat source, a temperature of the second heat source, and the temperature of the predetermined position, the temperatures of the first heat source, the temperature of the second heat source, and the detected temperature of the predetermined position.Type: ApplicationFiled: October 31, 2017Publication date: May 17, 2018Applicant: SEIKO EPSON CORPORATIONInventors: Sakiko SHIMIZU, Akira IKEDA
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Patent number: 9952105Abstract: A temperature measurement apparatus includes a first temperature sensor disposed so as to be close to a contact surface with an object to be measured in a thickness direction of an apparatus main body, and a second temperature sensor disposed so as to be close to a display unit in the thickness direction of the apparatus main body. The display unit is switched between a first display state and a second display state by switching a mark between display and non-display. An internal temperature of the object to be measured is calculated by using a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the first display state, and a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the second display state.Type: GrantFiled: March 4, 2016Date of Patent: April 24, 2018Assignee: SEIKO EPSON CORPORATIONInventors: Sakiko Shimizu, Akira Ikeda
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Publication number: 20180039749Abstract: A biological clock time calculating apparatus includes: a measuring portion which measures bio-information that changes on a daily basis; and an arithmetic processing portion which calculates biological clock time based on a measurement result of the measuring portion. A biological clock time calculating method may be configured to include: measuring bio-information which changes on a daily basis; and calculating biological clock time based on the measurement result.Type: ApplicationFiled: July 28, 2017Publication date: February 8, 2018Applicant: SEIKO EPSON CORPORATIONInventors: Akira IKEDA, Sakiko SHIMIZU, Ayae SAWADO, Hiroyuki MASUDA
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Publication number: 20170312453Abstract: A needle assembly includes: a needle comprising a hollow needle tube, a needle tip at a distal end of the hollow needle tube, and a cutting face disposed adjacent to the needle tip; and a needle hub that includes a tip and a base end, and holds the needle at the needle tip. The needle hub includes a needle tip side end face from which the needle tip projects. An outer diameter of the needle is within a range of 0.15 mm to 0.20 mm, inclusive. A projection needle length extending from the needle tip side end face to the needle tip is within a range of 0.50 mm to 1.25 mm, inclusive. A needle body length extending from the needle tip side end face to a proximal end of the cutting face in within a range of 0.10 mm to 0.70 mm, inclusive.Type: ApplicationFiled: July 19, 2017Publication date: November 2, 2017Applicant: TERUMO KABUSHIKI KAISHAInventors: Sakiko SHIMIZU, Sayaka OMORI, Kazunori KOIWAI, Yoichiro IWASE
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Publication number: 20170184523Abstract: An internal temperature measuring device is configured to include an acquisition unit that acquires a one side temperature and a one side heat flux of a measurement target on a one side surface side and an opposite side temperature and an opposite side heat flux of the measurement target on an opposite side surface side; and a computation unit that computes an internal temperature of the measurement target by applying the one side temperature, the one side heat flux, the opposite side temperature, and the opposite side heat flux.Type: ApplicationFiled: December 22, 2016Publication date: June 29, 2017Applicant: SEIKO EPSON CORPORATIONInventors: Akira IKEDA, Sakiko SHIMIZU, Kazuhiro NISHIDA
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Patent number: 9528887Abstract: A temperature measurement device includes a temperature measurement part, a calculation part, and a control part for controlling the operation of the temperature measurement part and the calculation part. The temperature measurement part has a substrate having a first surface as a contact surface with a measured body, and a second surface as an environment-lateral surface which is opposite the first surface, a first temperature sensor, a second temperature sensor, and a third temperature sensor, and the first temperature sensor. The second temperature sensor, and the third temperature sensor measure a first temperature, a second temperature, and a third temperature a plurality of times under conditions in which the temperature of the environment varies, and the calculation part calculates a deep temperature in a deep part of the measured body by using the measured temperatures.Type: GrantFiled: October 11, 2011Date of Patent: December 27, 2016Assignee: Seiko Epson CorporationInventor: Sakiko Shimizu
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Publication number: 20160258823Abstract: A temperature measurement apparatus includes a first temperature sensor disposed so as to be close to a contact surface with an object to be measured in a thickness direction of an apparatus main body, and a second temperature sensor disposed so as to be close to a display unit in the thickness direction of the apparatus main body. The display unit is switched between a first display state and a second display state by switching a mark between display and non-display. An internal temperature of the object to be measured is calculated by using a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the first display state, and a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the second display state.Type: ApplicationFiled: March 4, 2016Publication date: September 8, 2016Applicant: SEIKO EPSON CORPORATIONInventors: Sakiko SHIMIZU, Akira IKEDA
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Publication number: 20160252407Abstract: A heat flow sensor includes a heat transfer layer that has first and second surfaces confronting each other and has flexibility and a temperature difference measurement unit that measure's a temperature difference between the first and second surfaces of the heat transfer layer. The heat transfer layer includes a first member having flexibility and a second member with higher thermal conductivity than the first member. The thickness of the heat transfer layer is equal to or greater than 0.5 mm, thermal conductivity of the heat transfer layer is equal to or greater than 10 W/(m×K), and Shore hardness of the heat transfer layer is equal to or less than A50.Type: ApplicationFiled: February 25, 2016Publication date: September 1, 2016Applicant: SEIKO EPSON CORPORATIONInventors: Akira IKEDA, Sakiko SHIMIZU
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Publication number: 20160097712Abstract: A signal detection method includes acquiring a measurement signal including a first signal, which is a signal of a target component, and a second signal, which is a signal of an interference component; and performing an orthogonal operation for adjusting the measurement signal such that the measurement signal is orthogonal to the second signal.Type: ApplicationFiled: October 2, 2015Publication date: April 7, 2016Inventors: Sakiko SHIMIZU, Kazuhiro NISHIDA
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Publication number: 20160069752Abstract: A temperature measurement apparatus includes a first temperature sensor and a second temperature sensor which are provided at different positions inside a base which is in contact with a surface of a body to be measured, and a calculation processing unit which calculates a temperature of a measurement target position of the body to be measured using respective detected temperatures in the first and second temperature sensors. The calculation processing unit calculates a temperature of the measurement target position of the body to be measured using a heat balance relative coefficient indicating a relative relationship between heat balance characteristics at the respective positions of the first temperature sensor and the second temperature sensor when the base is in contact with the measurement target position and the surface of the body to be measured, and the respective detected temperatures in the first temperature sensor and the second temperature sensor.Type: ApplicationFiled: September 10, 2015Publication date: March 10, 2016Inventor: Sakiko SHIMIZU
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Patent number: 9068898Abstract: A thermometer includes first and second surface temperature measurement units, first and second reference temperature measurement units, a storage unit, a temperature correction unit, and a temperature calculation unit. The first reference temperature measurement unit measures a temperature at an opposite side of the first surface temperature measurement unit as a first reference temperature through a first heat insulating portion having a first thermal resistance value. The second reference temperature measurement unit measures a temperature at an opposite side of the second surface temperature measurement unit as a second reference temperature through a second heat insulating portion having a second thermal resistance value. The temperature correction unit corrects the first surface temperature and the first reference temperature based on the second surface temperature and the second reference temperature.Type: GrantFiled: April 30, 2014Date of Patent: June 30, 2015Assignee: Seiko Epson CorporationInventor: Sakiko Shimizu
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Patent number: 9015001Abstract: A temperature measurement device includes a temperature measurement part, a calculation part, and a control part for controlling the operation of the temperature measurement part and the calculation part; wherein the temperature measurement part has a substrate having a first surface as a contact surface with a measured body, and a second surface as an environment-side surface which is opposite the first surface; a first temperature sensor; a second temperature sensor; and an environment temperature acquiring part; and the first temperature sensor and the second temperature sensor measure a first temperature and a second temperature a plurality of times under conditions in which a third temperature varies; and the calculation part calculates a deep temperature in a deep part of the measured body, on the basis of a deep temperature calculation equation, by using the measured temperatures.Type: GrantFiled: September 9, 2011Date of Patent: April 21, 2015Assignee: Seiko Epson CorporationInventor: Sakiko Shimizu
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Publication number: 20140343887Abstract: A temperature measurement device includes a temperature measurement part, a heat insulator, and a calculation part. The temperature measurement part is disposed among the heat insulator and has a substrate as a heating medium having a first surface as a contact surface configured to contact a measured body, a first temperature sensor configured to measure, as a first temperature, the temperature at a first measurement point of the substrate, and a second temperature sensor for measuring, as a second temperature, the temperature at a second measurement point different from the first measurement point of the substrate. The first measurement point and the second measurement point are positioned on an external surface of the substrate or inside of the substrate. The calculation part calculates a deep temperature in a deep part of the measured body distant from the first surface on the basis of the first temperature and the second temperature.Type: ApplicationFiled: August 5, 2014Publication date: November 20, 2014Inventor: Sakiko SHIMIZU
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Publication number: 20140278201Abstract: A temperature measurement device 100 includes: a first temperature sensor 11 and a second temperature sensor 12 that are provided at different positions in a base portion 100 that is in contact with a measurement subject; and a computation processing unit 300 configured to calculate a temperature of the measurement subject by using temperatures detected by the first temperature sensor 11 and the second temperature sensor 12.Type: ApplicationFiled: March 10, 2014Publication date: September 18, 2014Applicant: SEIKO EPSON CORPORATIONInventor: Sakiko SHIMIZU
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Publication number: 20140233604Abstract: A thermometer includes first and second surface temperature measurement units, first and second reference temperature measurement units, a storage unit, a temperature correction unit, and a temperature calculation unit. The first reference temperature measurement unit measures a temperature at an opposite side of the first surface temperature measurement unit as a first reference temperature through a first heat insulating portion having a first thermal resistance value. The second reference temperature measurement unit measures a temperature at an opposite side of the second surface temperature measurement unit as a second reference temperature through a second heat insulating portion having a second thermal resistance value. The temperature correction unit corrects the first surface temperature and the first reference temperature based on the second surface temperature and the second reference temperature.Type: ApplicationFiled: April 30, 2014Publication date: August 21, 2014Applicant: SEIKO EPSON CORPORATIONInventor: Sakiko SHIMIZU