Patents by Inventor Sakumi Moriguchi

Sakumi Moriguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for automatic analysis of electron beam diffraction pattern
    Patent number: 4553030
    Abstract: A video image of an electron diffraction pattern is digitized and captured as a two dimensional array of intensity values. From the array of intensity values, the frequency distribution of said intensity values is obtained. It is determined that the diffraction pattern is composed of only diffraction spots, only diffraction rings, or both diffraction spots and rings by analyzing said frequency distribution. The diffraction pattern is thus analyzed easily and automatically.
    Type: Grant
    Filed: February 29, 1984
    Date of Patent: November 12, 1985
    Assignees: Jeol Ltd., Central Research Institute of Electric Power Industry
    Inventors: Moriyasu Tokiwai, Sakumi Moriguchi, Takao Shinkawa