Abstract: Systems, methods, and apparatus for complementary self-limiting logic are disclosed. In one or more embodiments, a method for mitigating errors caused by transients in a logic gate transistor comprises biasing, by a first stage of transistors, a second stage of transistors such that a voltage potential across terminals of each of the transistors of the second stage are at an equal voltage potential. The method further comprises biasing, by the second stage of transistors, the logic gate transistor such that a voltage potential across terminals of the logic gate transistor are at an equal voltage potential, thereby ensuring that the transients will not cause the logic gate transistor to erroneously change logic states when the logic gate transistor is in a logically off state.

Abstract: A circuit and methods for mitigating radiation-induced Single Event Effects (SEE) in Silicon-on-Insulator (SOI) Complementary Metal-Oxide-Semiconductor (CMOS) integrated circuits are presented. A primary logic output is generated from a primary logic gate in response to an input. A redundant logic output is generated from a redundant logic gate that duplicates the primary logic output in response to the input if an SEE is not present. An interleaved C-gate output is generated from an interleaved C-gate that emulates an inverter output when the primary logic output and the redundant logic output match, and does not changes its output when the primary logic output and the redundant logic output do not match during the SEE.

Abstract: A circuit and methods for mitigating radiation-induced Single Event Effects (SEE) in Silicon-on-Insulator (SOI) Complementary Metal-Oxide-Semiconductor (CMOS) integrated circuits are presented. A primary logic output is generated from a primary logic gate in response to an input. A redundant logic output is generated from a redundant logic gate that duplicates the primary logic output in response to the input if an SEE is not present. An interleaved C-gate output is generated from an interleaved C-gate that emulates an inverter output when the primary logic output and the redundant logic output match, and does not changes its output when the primary logic output and the redundant logic output do not match during the SEE.