Patents by Inventor Sam Ekong

Sam Ekong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11205064
    Abstract: Methods are provided to determine a quality score for depth map. The quality score is calculated from metrics that detect artifacts or other inaccuracies in the depth map such as flat patches, artifactual edges, and patchy regions. A flatness metric detects regions of neighboring pixels that have substantially the same depth value. A jaggedness metric detects hard edges or other discontinuities. A patchiness metric detects regions that are wholly enclosed by an edge and that have sub-threshold areas. The individual metrics are normalized and combined to determine an overall quality score for the depth map. The quality score can then be compared to one or more thresholds to determine a quality label for the depth map. Such a quality label can then be used to unlock a device, to invalidate an unlock attempt, to recalibrate a depth sensor, or to perform some other operations.
    Type: Grant
    Filed: June 15, 2020
    Date of Patent: December 21, 2021
    Assignee: Google LLC
    Inventors: Wen-Sheng Chu, Sam Ekong, Kuntal Sengupta
  • Publication number: 20210390286
    Abstract: Methods are provided to determine a quality score for depth map. The quality score is calculated from metrics that detect artifacts or other inaccuracies in the depth map such as flat patches, artifactual edges, and patchy regions. A flatness metric detects regions of neighboring pixels that have substantially the same depth value. A jaggedness metric detects hard edges or other discontinuities. A patchiness metric detects regions that are wholly enclosed by an edge and that have sub-threshold areas. The individual metrics are normalized and combined to determine an overall quality score for the depth map. The quality score can then be compared to one or more thresholds to determine a quality label for the depth map. Such a quality label can then be used to unlock a device, to invalidate an unlock attempt, to recalibrate a depth sensor, or to perform some other operations.
    Type: Application
    Filed: June 15, 2020
    Publication date: December 16, 2021
    Inventors: Wen-Sheng Chu, Sam Ekong, Kuntal Sengupta