Abstract: A latency control circuit includes a clock delay configured to output a plurality of serial delay signals obtained by serially delaying an input clock signal with the same intervals, a deviation information generating unit configured to generate a deviation information on the basis of a delay value, which the clock signal undergoes in a chip, and latency information, a clock selector configured to output a plurality of clock selection signals based on the plurality of serial delay signals and the deviation information, a command signal processing unit configured to generate a read signal based on an input command signal, and output a variable delay duplication signal by variably delaying the read signal, and a latency shifter configured to output a latency signal by combining the plurality of clock selection signals with the variable delay duplication signal.

Abstract: A latency control circuit includes a clock delay configured to output a plurality of serial delay signals obtained by serially delaying an input clock signal with the same intervals, a deviation information generating unit configured to generate a deviation information on the basis of a delay value, which the clock signal undergoes in a chip, and latency information, a clock selector configured to output a plurality of clock selection signals based on the plurality of serial delay signals and the deviation information, a command signal processing unit configured to generate a read signal based on an input command signal, and output a variable delay duplication signal by variably delaying the read signal, and a latency shifter configured to output a latency signal by combining the plurality of clock selection signals with the variable delay duplication signal.

Abstract: Disclosed is a shift register including a plurality of flip-flops configured in series to shift input data in response to an applied clock, and a drive operation controller.

Abstract: A wafer processing method for improving gettering capabilities of wafers made therefrom is presented. The method includes the steps of preparing, annealing and ion-implanting. The preparing step involves preparing the wafer from a silicon ingot. The annealing step involves forming first gettering sites in both sides of the wafer by annealing the wafer. The ion-implanting step involves forming second gettering sites in a back side of the wafer in which the first gettering sites are already formed.

Abstract: Disclosed is a shift register including a plurality of flip-flops configured in series to shift input data in response to an applied clock, and a drive operation controller.

Abstract: A wafer processing method for improving gettering capabilities of wafers made therefrom is presented. The method includes the steps of preparing, annealing and ion-implanting. The preparing step involves preparing the wafer from a silicon ingot. The annealing step involves forming first gettering sites in both sides of the wafer by annealing the wafer. The ion-implanting step involves forming second gettering sites in a back side of the wafer in which the first gettering sites are already formed.