Abstract: A container is provided with a cylindrical sidewall. A top flange projects from the cylindrical sidewall in a first direction by a first distance. A bottom flange projects from the sidewall in the first direction by a second distance that is less than the first distance. The top flange and the bottom flange extend circumferentially around the sidewall. A gap is formed between the top flange and the bottom flange.

Abstract: A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.