Patents by Inventor Sameer V. Tipnis

Sameer V. Tipnis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7486766
    Abstract: The present invention provides internal gain charge coupled devices (CCD) and CT scanners that incorporate an internal gain CCD. A combined positron emission tomography and CT scanner is also provided.
    Type: Grant
    Filed: February 25, 2008
    Date of Patent: February 3, 2009
    Assignee: Radiation Monitoring Devices, Inc.
    Inventors: Vivek V Nagarkar, Sameer V Tipnis
  • Patent number: 7352840
    Abstract: The present invention provides internal gain charge coupled devices (CCD) and CT scanners that incorporate an internal gain CCD. A combined positron emission tomography and CT scanner is also provided.
    Type: Grant
    Filed: June 21, 2005
    Date of Patent: April 1, 2008
    Assignee: Radiation Monitoring Devices, Inc.
    Inventors: Vivek V. Nagarkar, Sameer V. Tipnis
  • Patent number: 6921909
    Abstract: A method of fabricating an apparatus for an enhanced imaging sensor consisting of pixellated micro columnar scintillation film material for x-ray imaging comprising a scintillation substrate and a micro columnar scintillation film material in contact with the scintillation substrate. The micro columnar scintillation film material is formed from a doped scintillator material. According to the invention, the micro columnar scintillation film material is subdivided into arrays of optically independent pixels having interpixel gaps between the optically independent pixels. These optically independent pixels channel detectable light to a detector element thereby reducing optical crosstalk between the pixels providing for an X-ray converter capable of increasing efficiency without the associated loss of spatial resolution. The interpixel gaps are further filled with a dielectric and or reflective material to substantially reduce optical crosstalk and enhance light collection efficiency.
    Type: Grant
    Filed: August 27, 2002
    Date of Patent: July 26, 2005
    Assignee: Radiation Monitoring Devices, Inc.
    Inventors: Vivek V. Nagarkar, Sameer V. Tipnis
  • Publication number: 20040042585
    Abstract: A method of fabricating an apparatus for an enhanced imaging sensor consisting of pixellated micro columnar scintillation film material for x-ray imaging comprising a scintillation substrate and a micro columnar scintillation film material in contact with the scintillation substrate. The micro columnar scintillation film material is formed from a doped scintillator material. According to the invention, the micro columnar scintillation film material is subdivided into arrays of optically independent pixels having interpixel gaps between the optically independent pixels. These optically independent pixels channel detectable light to a detector element thereby reducing optical crosstalk between the pixels providing for an X-ray converter capable of increasing efficiency without the associated loss of spatial resolution. The interpixel gaps are further filled with a dielectric and or reflective material to substantially reduce optical crosstalk and enhance light collection efficiency.
    Type: Application
    Filed: August 27, 2002
    Publication date: March 4, 2004
    Inventors: Vivek V. Nagarkar, Sameer V. Tipnis