Patents by Inventor Sami Akhtar
Sami Akhtar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11509735Abstract: A method for facilitating operations in storage facilities. A server receives a service request for performing a first operation in the storage facility. The server identifies a first storage unit based on the service request. The server identifies an operation zone of the first storage unit for performing the first operation. The server determines an ergonomic score for each operator for performing the first operation based on characteristics of the operation zone and the fatigue level of the corresponding operator. The server allocates the first storage unit to a first operator for performing the first operation, based on the determined ergonomic scores, thereby ensuring an increased throughput of the storage facility.Type: GrantFiled: July 30, 2019Date of Patent: November 22, 2022Assignee: GREY ORANGE PTE. LTD.Inventors: Sami Akhtar, Srijan Choudhary
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Publication number: 20210037106Abstract: A method for facilitating operations in storage facilities. A server receives a service request for performing a first operation in the storage facility. The server identifies a first storage unit based on the service request. The server identifies an operation zone of the first storage unit for performing the first operation. The server determines an ergonomic score for each operator for performing the first operation based on characteristics of the operation zone and the fatigue level of the corresponding operator. The server allocates the first storage unit to a first operator for performing the first operation, based on the determined ergonomic scores, thereby ensuring an increased throughput of the storage facility.Type: ApplicationFiled: July 30, 2019Publication date: February 4, 2021Applicant: GREY ORANGE PTE. LTD.Inventors: Sami Akhtar, Srijan Choudhary
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Patent number: 8117004Abstract: To increase the overall efficiency of a test apparatus, provided is a test module that includes an instruction information storage section that stores instruction information indicating an order in which basic patterns are expanded; a basic pattern data storage section that stores basic pattern data; a plurality of pattern generating sections that each include a temporary instruction information storage section, which temporarily stores a portion of the instruction information, and that each generate a test pattern supplied to a device under test by expanding the basic pattern data in the order indicated by the instruction information stored in the corresponding temporary instruction information storage section; and a plurality of position information storage sections that independently store position information indicating reading positions of the instruction information stored in the instruction information storage section that is common to the plurality of pattern generating sections, in association with eType: GrantFiled: March 30, 2008Date of Patent: February 14, 2012Assignee: Advantest CorporationInventors: Sami Akhtar, Kiyoshi Murata, Tomoyuki Sugaya
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Patent number: 8010851Abstract: A testing module including a designation information storing section that stores designation information designating an order of decoding fundamental patterns, a fundamental pattern storing section that stores the fundamental patterns, a plurality of pattern generating sections that each generate a test pattern to be supplied to a device under test, a plurality of position information storing sections that each store, in association with a corresponding pattern generating section, position information designating a read position from which the designation information is read from the designation information storing section, and an information transmission path shared by the pattern generating sections that transmits a part of the designation information from the designation information storing section to the designation information temporary storing section in each pattern generating section.Type: GrantFiled: March 31, 2008Date of Patent: August 30, 2011Assignee: Advantest CorporationInventors: Sami Akhtar, Kiyoshi Murata, Tomoyuki Sugaya
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Patent number: 7779313Abstract: Provided is test apparatus with higher testing efficiency, including: plurality of pattern generating sections generating test pattern to supply to devices under test; group control section controlling group of pattern generating sections out of the pattern generating sections, and generating control signal upon receiving signal output from any pattern generating section controlled; range information storage section storing range information indicating range of pattern generating sections, out of the pattern generating sections, that serve to test one independent device under test; and comprehensive control section receiving the control signal from the group control section, identifying any pattern generating section that supplies the test pattern to the same device under test as that to which the pattern generating section having output the signal supplies the test pattern based on the range information, and in response to the control signal, controlling any other group control section that controls the idenType: GrantFiled: March 30, 2008Date of Patent: August 17, 2010Assignee: Advantest CorporationInventors: Kiyoshi Murata, Tomoyuki Sugaya, Sami Akhtar
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Publication number: 20090249137Abstract: There is provided a testing module including a designation information storing section that stores thereon designation information designating an order of decoding fundamental patterns, a fundamental pattern storing section that stores thereon the fundamental patterns in a data form, a plurality of pattern generating sections each of which has a designation information temporary storing section that temporarily stores thereon part of the designation information, where each pattern generating section generates a test pattern to be supplied to a device under test by decoding the fundamental patterns in an order designated by the partial designation information stored on the designation information temporary storing section, a plurality of position information storing sections each of which stores thereon, in association with a corresponding one of the plurality of pattern generating sections, position information designating a read position from which the designation information is read from the designation infType: ApplicationFiled: March 31, 2008Publication date: October 1, 2009Applicant: ADVANTEST CORPORATIONInventors: SAMI AKHTAR, Kiyoshi Murata, Tomoyuki Sugaya
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Publication number: 20090249135Abstract: Provided is test apparatus with higher testing efficiency, including: plurality of pattern generating sections generating test pattern to supply to devices under test; group control section controlling group of pattern generating sections out of the pattern generating sections, and generating control signal upon receiving signal output from any pattern generating section controlled; range information storage section storing range information indicating range of pattern generating sections, out of the pattern generating sections, that serve to test one independent device under test; and comprehensive control section receiving the control signal from the group control section, identifying any pattern generating section that supplies the test pattern to the same device under test as that to which the pattern generating section having output the signal supplies the test pattern based on the range information, and in response to the control signal, controlling any other group control section that controls the idenType: ApplicationFiled: March 30, 2008Publication date: October 1, 2009Applicant: ADVANTEST CORPORATIONInventors: KIYOSHI MURATA, Tomoyuki Sugaya, Sami Akhtar
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Publication number: 20090248347Abstract: To increase the overall efficiency of a test apparatus, provided is a test module that includes an instruction information storage section that stores instruction information indicating an order in which basic patterns are expanded; a basic pattern data storage section that stores basic pattern data; a plurality of pattern generating sections that each include a temporary instruction information storage section, which temporarily stores a portion of the instruction information, and that each generate a test pattern supplied to a device under test by expanding the basic pattern data in the order indicated by the instruction information stored in the corresponding temporary instruction information storage section; and a plurality of position information storage sections that independently store position information indicating reading positions of the instruction information stored in the instruction information storage section that is common to the plurality of pattern generating sections, in association with eType: ApplicationFiled: March 30, 2008Publication date: October 1, 2009Applicant: ADVANTEST CORPORATIONInventors: SAMI AKHTAR, Kiyoshi Murata, Tomoyuki Sugaya