Patents by Inventor Samuel Ives Nackash

Samuel Ives Nackash has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11293993
    Abstract: A method, a non-transitory computer readable medium and a detection system for detecting an electric arc hazard related to a wafer. The detection system may include a measurement unit, an electrode and a processing unit. The measurement unit may be configured to provide a measurement result by measuring an electrical parameter of the electrode during a test period, while the wafer may be moved in relation to the electrode, and while a certain electrical field may be formed between the electrode and the wafer; wherein the certain electrical field induces detached ends of partially detached conductive elements of the wafer to move away from the wafer. The processing unit may be configured to determine an existence of the electric arc hazard based on the measurement result.
    Type: Grant
    Filed: September 4, 2019
    Date of Patent: April 5, 2022
    Assignee: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Yosef Basson, Samuel Ives Nackash, Ittamar Levy
  • Publication number: 20210063461
    Abstract: A method, a non-transitory computer readable medium and a detection system for detecting an electric arc hazard related to a wafer. The detection system may include a measurement unit, an electrode and a processing unit. The measurement unit may be configured to provide a measurement result by measuring an electrical parameter of the electrode during a test period, while the wafer may be moved in relation to the electrode, and while a certain electrical field may be formed between the electrode and the wafer; wherein the certain electrical field induces detached ends of partially detached conductive elements of the wafer to move away from the wafer. The processing unit may be configured to determine an existence of the electric arc hazard based on the measurement result.
    Type: Application
    Filed: September 4, 2019
    Publication date: March 4, 2021
    Applicant: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Yosef Basson, Samuel Ives Nackash, Ittamar Levy
  • Patent number: 10716197
    Abstract: A computer program product and a method for dissipation of an electrical charge stored in a region of an object. The method may include (a) sensing, by at least one sensor, an electrical charging status of the region of the object, while the object is located within a vacuum chamber and while a gaseous pressure within the vacuum chamber is below a certain vacuum pressure threshold; and (b) performing, based on the charging status of the given region, an electrical charge dissipation process that comprises increasing the gaseous pressure within the vacuum chamber to be within a given gaseous pressure range that facilitates a dissipation, by breakdown, of the electrical charge stored in the region of the object to the vacuum chamber.
    Type: Grant
    Filed: September 19, 2017
    Date of Patent: July 14, 2020
    Assignee: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Guy Eytan, Emil Weisz, Samuel Ives Nackash, Albert Karabekov
  • Publication number: 20190090335
    Abstract: A computer program product and a method for dissipation of an electrical charge stored in a region of an object. The method may include (a) sensing, by at least one sensor, an electrical charging status of the region of the object, while the object is located within a vacuum chamber and while a gaseous pressure within the vacuum chamber is below a certain vacuum pressure threshold; and (b) performing, based on the charging status of the given region, an electrical charge dissipation process that comprises increasing the gaseous pressure within the vacuum chamber to be within a given gaseous pressure range that facilitates a dissipation, by breakdown, of the electrical charge stored in the region of the object to the vacuum chamber.
    Type: Application
    Filed: September 19, 2017
    Publication date: March 21, 2019
    Applicant: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Guy Eytan, Emil Weisz, Samuel Ives Nackash, Albert Karabekov
  • Patent number: 9817208
    Abstract: A chuck interface that includes a mirror; an inner surface that is shaped and sized to match a portion of a sidewall of a chuck; wherein the inner surface is mechanically coupled to the mirror; and at least one interfacing element for assisting in attaching the chuck to the mirror; and wherein a difference between a thermal expansion coefficient of the chuck and a thermal expansion coefficient of the mirror does not exceed 0.5 micron*Kelvin per Meter.
    Type: Grant
    Filed: September 20, 2016
    Date of Patent: November 14, 2017
    Assignee: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Efim Vinnitsky, Samuel Ives Nackash, Yohanan Madmon
  • Patent number: 9805906
    Abstract: A mirror support module having a body that includes an internal portion surrounding an inner space, an external portion, an aperture formed in the body and an intermediate region that extends between a segment of the internal portion and the aperture. When the intermediate region is subjected to a force directed in a first direction, the intermediate region can be moved in the first direction towards the aperture to reduce an area of the aperture while the external portion remains stable regardless of movement of the intermediate region.
    Type: Grant
    Filed: September 20, 2016
    Date of Patent: October 31, 2017
    Assignee: APPLIED MATERIALS ISRAEL, LTD.
    Inventors: Efim Vinnitsky, Samuel Ives Nackash, Shmuel Barak Mizrahi, Natan Schlimoff