Patents by Inventor Samuel P. Herko

Samuel P. Herko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6534772
    Abstract: A microchannel phosphor screen for converting radiation, such as X-rays, into visible light. The screen includes a planar surface, which can be formed from glass, silicon or metal, which has etched therein a multiplicity of closely spaced microchannels having diameters of the order of 40 microns or less. Deposited within each of the microchannels is a multiplicity of phosphors which emit light when acted upon by radiation. The dimensions of the microchannel and the phosphors and the relationship between the microchannels and the phosphors is optimized so that the light output compares favorably with lower resolution non microchannel based scintillation screens. A photomultiplier can be integrated with the X-ray detector so as to provide an enhanced output for use with low level X-ray of for cine or fluoroscopy applications.
    Type: Grant
    Filed: October 16, 2000
    Date of Patent: March 18, 2003
    Assignee: Nanocrystal Imaging Corp.
    Inventors: Vishal Chhabra, Rameshwar Nath Bhargava, Dennis Gallagher, Samuel P. Herko, Bharati S. Kulkarni, Nikhil R. Taskar, Aleksey Yekimov
  • Patent number: 5053705
    Abstract: A read/write head particularly suitable for mapping the superconductive properties of a sample of superconducting material. The head is arranged so that the reading and writing gaps are coaxial. Although the gaps are coaxial, the reading gap and the writing gap may be optimized in length and width to provide efficient reading and writing performance. The coaxial disposition of the heads eliminates parallax error to permit detailed mapping of the properties of the surface of a sample of superconductive material.
    Type: Grant
    Filed: December 27, 1989
    Date of Patent: October 1, 1991
    Assignee: North American Philips Corp.
    Inventor: Samuel P. Herko
  • Patent number: 5030912
    Abstract: Apparatus and methodology for mapping the superconductive properties of a sample of superconducting material. The material is cooled so that it is a mixed state and an alternating magnetic field is induced in a portion of the sample to be tested. The harmonic component of the induced alternating magnetic response is measured at a location proximate to the point of induction. As the inducing and measuring devices are displaced relative to the sample the measured amplitude of the harmonic component is stored in suitable storage means as a function of location in the sample. Thus, a map of the superconducting properties of the sample may be generated.
    Type: Grant
    Filed: December 21, 1989
    Date of Patent: July 9, 1991
    Assignee: North American Philips Corp.
    Inventors: Samuel P. Herko, Rameshwar N. Bhargava, Avner A. Shaulov
  • Patent number: 5004726
    Abstract: Apparatus and methodology for the rapid and inexpensive characterization of superconducting materials. The method and apparatus induces an alternating magnetic field in the sample to be tested. If the material is a superconductor odd harmonics are generated in the alternating magnetic response of the material near the transition temperature. The superconducting transitions are manifested by a peak or peaks in the odd harmonic components of the alternating magnetic response as a function of temperature. The peaks of the harmonic components are detected to indicate the presence and number of superconducting transitions.
    Type: Grant
    Filed: July 14, 1989
    Date of Patent: April 2, 1991
    Assignee: North American Philips Corp.
    Inventors: Avner A. Shaulov, Samuel P. Herko, Donald R. Dorman, Rameshwar N. Bhargava