Patents by Inventor Samuele Carrera

Samuele Carrera has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Metrological structures particularly for direct measurement of errors introduced by alignment systems
    Patent number: 5985494
    Abstract: Process for producing metrological structures particularly for direct measurement of errors introduced by alignment systems, whose peculiarity consists in performing, on a same substrate, metrological alignment markings and processed alignment markings according to arrays of preset numerical size.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: November 16, 1999
    Assignee: SGS-Thomson Microelectronics S.r.l.
    Inventors: Paolo Canestrari, Samuele Carrera, Giovanni Rivera
  • Process for producing metrological structures particularly for direct measurement of errors introduced by alignment systems
    Patent number: 5622796
    Abstract: Process for producing metrological structures particularly for direct measurement of errors introduced by alignment systems, whose peculiarity consists in performing, on a same substrate, metrological alignment markings and processed alignment markings according to arrays of preset numerical size.
    Type: Grant
    Filed: December 22, 1994
    Date of Patent: April 22, 1997
    Assignee: SGS-Thomson Microelectronics S.r.l.
    Inventors: Paolo Canestrari, Samuele Carrera, Giovanni Rivera