Patents by Inventor Samvel Goukassian

Samvel Goukassian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5848118
    Abstract: A method and apparatus is provided for inspection in real-time of inhomogeneities at particular locations of objects using x-radiation. An object is fixed on a conveyor by a system of clamps, and a manipulator positions an x-ray source and detector such that the particular location to be inspected is between the two. X-ray photons passing through the spot to be inspected are recorded by the detector. When the manipulator is at the required position, the electronic control system (ECS) gives a `start` signal and the monitor begins to count the pulses from the detector. After a specified time, a `stop` signal passes from the ECS, and the monitor stops counting, while the manipulator passes to the following position to be inspected. The information coming from the detector is processed in the monitor. If no inhomogeneities are detected, the monitor gives permission for inspection of the following object, otherwise an alarm signal is triggered.
    Type: Grant
    Filed: June 19, 1997
    Date of Patent: December 8, 1998
    Assignee: Lear Corporation
    Inventor: Samvel Goukassian