Patents by Inventor Sanae IIDA

Sanae IIDA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Structure evaluation system, structure evaluation apparatus, and structure evaluation method
    Patent number: 11519883
    Abstract: According to one embodiment, a structure evaluation system of the embodiments includes a plurality of sensors, an arrival time determiner, a reliability calculator, and a map generator. The plurality of sensors detect elastic waves. The arrival time determiner determines arrival times of the elastic waves using elastic waves detected by the plurality of respective sensors. The reliability calculator calculates reliabilities related to measurement waveforms of the elastic waves on the basis of the arrival times. The map generator generates a first map on the basis of the calculated reliabilities or the reliabilities and a distance.
    Type: Grant
    Filed: September 4, 2020
    Date of Patent: December 6, 2022
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Sanae Iida, Takashi Usui
  • STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND STRUCTURE EVALUATION METHOD
    Publication number: 20210096110
    Abstract: According to one embodiment, a structure evaluation system of the embodiments includes a plurality of sensors, an arrival time determiner, a reliability calculator, and a map generator. The plurality of sensors detect elastic waves. The arrival time determiner determines arrival times of the elastic waves using elastic waves detected by the plurality of respective sensors. The reliability calculator calculates reliabilities related to measurement waveforms of the elastic waves on the basis of the arrival times. The map generator generates a first map on the basis of the calculated reliabilities or the reliabilities and a distance.
    Type: Application
    Filed: September 4, 2020
    Publication date: April 1, 2021
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Sanae IIDA, Takashi USUI
  • Structure evaluation system, structure evaluation apparatus, and structure evaluation method
    Patent number: 10458954
    Abstract: According to an embodiment, a structure evaluation system has a plurality of sensors, a signal processor, and an evaluator. The sensors detect an elastic wave generated from a structure. The signal processor acquires a reliability from a source of the elastic wave to the plurality of sensors by performing signal processing on the elastic wave detected by the plurality of sensors. The evaluator evaluates the soundness of the structure on the basis of the acquired reliability.
    Type: Grant
    Filed: March 9, 2017
    Date of Patent: October 29, 2019
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Sanae Iida, Takashi Usui
  • Structure evaluation system, structure evaluation apparatus, and structure evaluation method
    Patent number: 10352912
    Abstract: According to an embodiment, a structure evaluation system has a plurality of sensors, a signal processor, and an evaluator. The sensors detect an elastic wave generated from a structure. The signal processor acquires a reliability from a source of the elastic wave to the plurality of sensors by performing signal processing on the elastic wave detected by the plurality of sensors. The evaluator evaluates the soundness of the structure on the basis of the acquired reliability.
    Type: Grant
    Filed: March 10, 2017
    Date of Patent: July 16, 2019
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Sanae Iida, Takashi Usui
  • STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND STRUCTURE EVALUATION METHOD
    Publication number: 20180074023
    Abstract: According to an embodiment, a structure evaluation system has a plurality of sensors, a signal processor, and an evaluator. The sensors detect an elastic wave generated from a structure. The signal processor acquires a reliability from a source of the elastic wave to the plurality of sensors by performing signal processing on the elastic wave detected by the plurality of sensors. The evaluator evaluates the soundness of the structure on the basis of the acquired reliability.
    Type: Application
    Filed: March 9, 2017
    Publication date: March 15, 2018
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Sanae IIDA, Takashi USUI
  • STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND STRUCTURE EVALUATION METHOD
    Publication number: 20180074019
    Abstract: According to an embodiment, a structure evaluation system has a plurality of sensors, a signal processor, and an evaluator. The sensors detect an elastic wave generated from a structure. The signal processor acquires a reliability from a source of the elastic wave to the plurality of sensors by performing signal processing on the elastic wave detected by the plurality of sensors. The evaluator evaluates the soundness of the structure on the basis of the acquired reliability.
    Type: Application
    Filed: March 10, 2017
    Publication date: March 15, 2018
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Sanae IIDA, Takashi USUI