Patents by Inventor Sandamali Devadithya

Sandamali Devadithya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • MILLIMETER WAVE AND/OR MICROWAVE IMAGING SYSTEMS AND METHODS INCLUDING EXAMPLES OF PARTITIONED INVERSE AND ENHANCED RESOLUTION MODES AND IMAGING DEVICES
    Publication number: 20230079634
    Abstract: Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be used to provide multiple estimates of reflectivity values associated with a scene. The processing may be partitioned in accordance with a relative position of the antenna system and/or a particular beamwidth of an antenna. Examples described herein may perform an enhanced resolution mode of imaging which may steer beams at multiple angles for each measurement position.
    Type: Application
    Filed: September 20, 2022
    Publication date: March 16, 2023
    Applicant: University of Washington
    Inventors: Matthew S. Reynolds, Andreas Pedross-Engel, Claire Watts, Sandamali Devadithya
  • Millimeter wave and/or microwave imaging systems and methods including examples of partitioned inverse and enhanced resolution modes and imaging devices
    Patent number: 11555916
    Abstract: Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be used to provide multiple estimates of reflectivity values associated with a scene. The processing may be partitioned in accordance with a relative position of the antenna system and/or a particular beamwidth of an antenna. Examples described herein may perform an enhanced resolution mode of imaging which may steer beams at multiple angles for each measurement position.
    Type: Grant
    Filed: December 8, 2017
    Date of Patent: January 17, 2023
    Assignee: University of Washington
    Inventors: Matthew S. Reynolds, Andreas Pedross-Engel, Claire Watts, Sandamali Devadithya
  • MILLIMETER WAVE AND/OR MICROWAVE IMAGING SYSTEMS AND METHODS INCLUDING EXAMPLES OF PARTIONED INVERSE AND ENHANCED RESOLUTION MODES AND IMAGING DEVICES
    Publication number: 20210405182
    Abstract: Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be used to provide multiple estimates of reflectivity values associated with a scene. The processing may be partitioned in accordance with a relative position of the antenna system and/or a particular beamwidth of an antenna. Examples described herein may perform an enhanced resolution mode of imaging which may steer beams at multiple angles for each measurement position.
    Type: Application
    Filed: December 8, 2017
    Publication date: December 30, 2021
    Applicant: University of Washington
    Inventors: Matthew S. Reynolds, Andreas Pedross-Engel, Claire Watts, Sandamali Devadithya