Patents by Inventor Sandeep A. Aji

Sandeep A. Aji has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7137097
    Abstract: A method, system, computer system, and computer program product including an algorithm that performs the constraints-based global routing step in the physical design of integrated circuits. The algorithm is based on finding routes for the entire circuit based on constraints being satisfied for the entire design. Initially, for each net, a set of possible routing solutions is determined based on applicable constraints. The possible solutions for the nets are combined to create a highly-connected “intersection graph,” with each intersection graph node representing a net. The intersection graph is partitioned based on constraints and performance criteria. An optimal solution is determined for each partition. The optimal solutions for the partitions are then combined to produce a global routing solution. The global routing solution is provided to a detailed router, which completes the routing for the design.
    Type: Grant
    Filed: June 25, 2004
    Date of Patent: November 14, 2006
    Assignee: Sun Microsystems, Inc.
    Inventors: Sandeep A. Aji, Ankur Narang, Shantanu Ganguly
  • Publication number: 20040044979
    Abstract: A method, system, computer system, and computer program product including an algorithm that performs the constraints-based global routing step in the physical design of integrated circuits. The algorithm is based on finding routes for the entire circuit based on constraints being satisfied for the entire design. Initially, for each net, a set of possible routing solutions is determined based on applicable constraints. The possible solutions for the nets are combined to create a highly-connected “intersection graph,” with each intersection graph node representing a net. The intersection graph is partitioned based on constraints and performance criteria. An optimal solution is determined for each partition. The optimal solutions for the partitions are then combined to produce a global routing solution. The global routing solution is provided to a detailed router, which completes the routing for the design.
    Type: Application
    Filed: August 27, 2002
    Publication date: March 4, 2004
    Inventors: Sandeep A. Aji, Ankur Narang, Shantanu Ganguly
  • Patent number: 6480996
    Abstract: An automatic and parameterized compute implemented method for transposing wires in an integrated circuit design can y bus lines with similar impedances, and therefore similar signal transmission characteristics. Using a specially designed CAD tool, a user can specify a transposing porn, intervals at which to transpose wires, and a metal layer through which to accomplish the transposing in the integrated circuit. Using a routing database the tool then automatically determines the locations in the design where transposing needs to be performed, re-routes the wires being transposed while optimizing the circuit design space being used, and re-routes (or causes the re-route of) any other wires affected by the transposing process. The result is a new version of the routing database reflecting transposition, but with no change to the circuit's netlist.
    Type: Grant
    Filed: July 6, 2000
    Date of Patent: November 12, 2002
    Assignee: Sun Microsystems, Inc.
    Inventors: Sandeep A. Aji, Shantanu Ganguly, John Paz
  • Patent number: 6072945
    Abstract: An automated apparatus detects electromigration violations in an integrated circuit design. Starting from the lowest hierarchy of the design so far completed, the parasitic (resistance and capacitance) component values extracted from a layout file are propagated up. Then, at the top-most level, lumping algorithms are employed to calculate the parasitic values for all of the top-most level nets. These values are then passed back down to the lower levels and then at each level, the layout is checked using previously computed parasitic values and EM limits. A peak current, AC-average current and AC-rms current are calculated for every layout, and then compared with the process EM rules for violations, in which the optimum line width and number of vias are specified for each interconnection.
    Type: Grant
    Filed: June 26, 1997
    Date of Patent: June 6, 2000
    Assignee: Sun Microsystems Inc.
    Inventors: Sandeep A. Aji, Manjunath Doreswamy, Georgios Konstadinidis
  • Patent number: 5963729
    Abstract: An automated method detects electromigration violations in an integrated circuit design. Starting from the lowest hierarchy of the design so far completed, the parasitic (resistance and capacitance) component values extracted from a layout file are propagated up. Then, at the top-most level, lumping algorithms are employed to calculate the parasitic values for all of the top-most level nets. These values are then passed back down to the lower levels and then at each level, the layout is checked using previously computed parasitic values and EM limits. A peak current, AC-average current and AC-rms current are calculated for every layout, and then compared with the process EM rules for violations, in which the optimum line width and number of vias are specified for each interconnection.
    Type: Grant
    Filed: June 26, 1997
    Date of Patent: October 5, 1999
    Assignee: Sun Microsystems Inc.
    Inventors: Sandeep A. Aji, Manjunath Doreswamy, Georgios Konstadinidis
  • Patent number: 5831867
    Abstract: An automated method and system for detecting electromigration violations in signal lines of an integrated circuit design to be fabricated is disclosed. The automated method and system checks conductive traces, vias and/or contacts that are used to route signals to and from various functional cells within the integrated circuit design against predetermined process rules to detect electromigration violations. The operation and effectiveness of the automated method and system are far superior to conventional manual approaches.
    Type: Grant
    Filed: June 24, 1996
    Date of Patent: November 3, 1998
    Assignee: Sun Microsystems, Inc.
    Inventors: Sandeep A. Aji, Meera Kasinathan
  • Patent number: 5623420
    Abstract: A method and apparatus to distribute spare cells into a standard cell region of an integrated circuit is described. An initial layout of standard cells is first generated by a place and route tool. Afterwards, the initial layout is processed by a spare cell distribution mechanism that simultaneously processes a directive file. The spare cell distribution mechanism distributes, according to a predefined criteria, a preselected cluster of spare cells within the initial layout of standard cells. This processing results in an optimal distribution of spare standard cells within the standard cell region of the semiconductor. The spare cell distribution mechanism also inserts vertical wire terminators into the standard cell region to promote vertical routing, and thus shorter routing paths. In addition, the spare cell distribution mechanism inserts ground connectors and power connectors in the standard cell region to generate a ground and power paths.
    Type: Grant
    Filed: November 16, 1994
    Date of Patent: April 22, 1997
    Assignee: Sun Microsystems, Inc.
    Inventors: Clayton L. Yee, Sandeep Aji, Stefan Rusu