Patents by Inventor Sandeep FOTEDAR

Sandeep FOTEDAR has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11099957
    Abstract: Compatibility testing systems and methods are disclosed that provide scalable validation testing of systems and devices. In examples, systems and devices are identified to provide fundamental information about driver operations and driver extensions functionality. The identification allows systems and devices having particular similarities to be grouped in object groups. Compatibility tests are tagged as corresponding to the identifiable systems, devices, and/or object groups, compatibility testing system and methods map test sets specifically tailored to systems and devices as identified by their driver operations and driver extensions functionality. The tailored test sets include tests that ensure compatibility and through optimized test-to-device target mapping, an optimal set of testing set is discovered and scheduled to run. Strategically controlling the amount of testing distributed and executed increases compatibility testing speed and scalability.
    Type: Grant
    Filed: August 1, 2019
    Date of Patent: August 24, 2021
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: George A. Kirita, Sandeep Fotedar, Yuen-Chen D. Chang
  • Publication number: 20210034487
    Abstract: Compatibility testing systems and methods are disclosed that provide scalable validation testing of systems and devices. In examples, systems and devices are identified to provide fundamental information about driver operations and driver extensions functionality. The identification allows systems and devices having particular similarities to be grouped in object groups. Compatibility tests are tagged as corresponding to the identifiable systems, devices, and/or object groups, compatibility testing system and methods map test sets specifically tailored to systems and devices as identified by their driver operations and driver extensions functionality. The tailored test sets include tests that ensure compatibility and through optimized test-to-device target mapping, an optimal set of testing set is discovered and scheduled to run. Strategically controlling the amount of testing distributed and executed increases compatibility testing speed and scalability.
    Type: Application
    Filed: August 1, 2019
    Publication date: February 4, 2021
    Inventors: George A. KIRITA, Sandeep FOTEDAR, Yuen-Chen D. CHANG