Patents by Inventor Sandeep Miryala

Sandeep Miryala has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240193116
    Abstract: An event-driven readout management system includes non-priority access arbitration of a plurality of channels. The system includes an arbitration tree circuit, response circuit, in-channel logic circuit, and output periphery circuit. The arbitration tree circuit determines to which of the plurality of channels to grant access to a common signal transfer resource shared by the plurality of channels based on a readout access request provided by at least one of the plurality of channels. The arbitration tree circuit terminates a prior readout transaction and commences a subsequent readout transaction in response to a single edge of a clock signal. The in-channel logic circuit terminates the prior readout transaction and commences the subsequent readout transaction in response to receiving an acknowledge token. The output periphery circuit converts information received from the plurality of channels into an output format on the common signal transfer resource.
    Type: Application
    Filed: March 31, 2022
    Publication date: June 13, 2024
    Applicant: Brookhaven Science Associates, LLC
    Inventors: Dominik Stanislaw Gorni, Grzegorz W. Deptuch, Sandeep Miryala
  • Patent number: 11966676
    Abstract: A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device.
    Type: Grant
    Filed: January 31, 2023
    Date of Patent: April 23, 2024
    Assignee: Fermi Research Alliance, LLC
    Inventors: Sandeep Miryala, James Richard Hoff, Grzegorz W. Deptuch
  • Publication number: 20230169248
    Abstract: A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device. The resultant layout generated from the TMR configuration may relax constraints imposed on register transfer level (RTL) engineers to make rad-hard designs.
    Type: Application
    Filed: January 31, 2023
    Publication date: June 1, 2023
    Applicant: Fermi Research Alliance, LLC
    Inventors: Sandeep Miryala, James Richard Hoff, Grzegorz W. Deptuch
  • Patent number: 11593542
    Abstract: A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device.
    Type: Grant
    Filed: February 26, 2021
    Date of Patent: February 28, 2023
    Assignee: Fermi Research Alliance, LLC
    Inventors: Sandeep Miryala, James Richard Hoff, Grzegorz W. Deptuch
  • Publication number: 20220277122
    Abstract: A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device.
    Type: Application
    Filed: February 26, 2021
    Publication date: September 1, 2022
    Applicant: Fermi Research Alliance, LLC
    Inventors: Sandeep Miryala, James Richard Hoff, Grzegorz W. Deptuch