Patents by Inventor Sander G. den Hartog

Sander G. den Hartog has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6680562
    Abstract: A electron emission cathode includes an emitter having an apex from which electrons are emitted. The emitter is attached to a heating filament at a junction and extends from the junction both forward toward the apex and rearward. A reservoir of material that lowers the work function of the emitter is positioned on the rearward extending portion of the emitter. By positioning the reservoir on the rearward extending portion, the reservoir can be positioned sufficiently far from the junction to reduce its temperature and thereby greatly increase the useful life, of the emitter without adversely affected the emission characteristics of the source.
    Type: Grant
    Filed: August 15, 2000
    Date of Patent: January 20, 2004
    Assignee: FEI Company
    Inventors: James B. McGinn, Sander G. den Hartog, David S. Jun, Gerald G. Magera, Gregory A. Schwind
  • Patent number: 6263042
    Abstract: In order to achieve suitable positional resolution for an angular scan in Grazing Exit X-ray Fluorescence (GEXRF), the sample (2) should be irradiated with a small spot (14). Consequently, the fluorescent radiation yield is low so that the duration of a measurement is comparatively long. In order to mitigate this drawback, the invention proposes the use of an analyzing X-ray mirror (16) having a line focus (22) extending perpendicularly to the sample surface (4). The line focus (22) coincides with a line-shaped PSD (24), so that every position on the PSD corresponds to a given height on the mirror, which height itself corresponds to a given take-off angle of the fluorescent radiation relative to the sample surface. Excellent positional resolution and an attractive fluorescent radiation yield are obtained by irradiating the sample by way of a focused electron beam.
    Type: Grant
    Filed: September 24, 1999
    Date of Patent: July 17, 2001
    Assignee: U.S. Philips Corporation
    Inventors: Sander G. den Hartog, Pieter K. de Bokx