Abstract: We describe apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation. They are particularly well suited for conducting automated sampling, sample preparation, and analysis in a multi-well plate assay format. For example, they may be used for automated analysis of particulates in air and/or liquid samples derived therefrom in environmental monitoring.

Abstract: We describe apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation. They are particularly well suited for conducting automated sampling, sample preparation, and analysis in a multi-well plate assay format. For example, they may be used for automated analysis of particulates in air and/or liquid samples derived therefrom in environmental monitoring.

Abstract: We describe apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation. They are particularly well suited for conducting automated sampling, sample preparation, and analysis in a multi-well plate assay format. For example, they may be used for automated analysis of particulates in air and/or liquid samples derived therefrom in environmental monitoring.

Abstract: We describe apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation. They are particularly well suited for conducting automated sampling, sample preparation, and analysis in a multi-well plate assay format. For example, they may be used for automated analysis of particulates in air and/or liquid samples derived therefrom in environmental monitoring.

Abstract: We describe apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation. They are particularly well suited for conducting automated sampling, sample preparation, and analysis in a multi-well plate assay format. For example, they may be used for automated analysis of particulates in air and/or liquid samples derived therefrom in environmental monitoring.

Abstract: We describe apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation. They are particularly well suited for conducting automated sampling, sample preparation, and analysis in a multi-well plate assay format. For example, they may be used for automated analysis of particulates in air and/or liquid samples derived therefrom in environmental monitoring.

Abstract: We describe apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation. They are particularly well suited for conducting automated sampling, sample preparation, and analysis in a multi-well plate assay format. For example, they may be used for automated analysis of particulates in air and/or liquid samples derived therefrom in environmental monitoring.

Abstract: A mirror structure includes a mirror, a reflective face, a cut in the mirror under the face, and a torsion arm attached to the mirror. Such a mirror structure often distorts a scanned image less than prior mirror structures because the cut uncouples the twist-induced strain in the torsion arm from the mirror face, and thus reduces the level of deformation that this strain imparts to the mirror face. Another mirror structure includes a base formed from a first material, a mirror attached to the base and formed from a second material, and a torsion arm attached to the base. Such a composite mirror structure often distorts a scanned image less than prior mirror structures because it reduces the acceleration-induced bending of the mirror and/or the twist-induced strain in the torsion arm, and thus reduces the level of deformation that this bending and/or strain impart to the mirror face.

Abstract: A mirror structure includes a mirror, a reflective face, a cut in the mirror under the face, and a torsion arm attached to the mirror. Such a mirror structure often distorts a scanned image less than prior mirror structures because the cut uncouples the twist-induced strain in the torsion arm from the mirror face, and thus reduces the level of deformation that this strain imparts to the mirror face. Another mirror structure includes a base formed from a first material, a mirror attached to the base and formed from a second material, and a torsion arm attached to the base. Such a composite mirror structure often distorts a scanned image less than prior mirror structures because it reduces the acceleration-induced bending of the mirror and/or the twist-induced strain in the torsion arm, and thus reduces the level of deformation that this bending and/or strain impart to the mirror face.