Abstract: Identification of points of interest in a region of the surface of a part, by bringing a surface reference into intimate contact with the region is disclosed. The surface reference includes a thin film sufficiently flexible to conform to the region and tracks made of electrically conductive material. The passage of an eddy current probe over a track delivers a significant signal representative of the track. This representative signal corresponds to a point of interest thus identified in the region. Thus, it possible to optimize the path and the angular position of an eddy current probe scanning a region of a part to be tested.

Abstract: Using eddy currents to inspect a hole that is possibly not rectilinear and/or of section that is not circular. The inspection device comprises a stick shaped and dimensioned to be capable of being engaged in said hole, at least one arm hinged to a support fastened to one end of the stick, an eddy current sensor being embedded in said arm, and resilient means for urging the arm outwards against the inside surface of the hole.

Abstract: Using eddy currents to inspect a hole that is possibly not rectilinear and/or of section that is not circular. The inspection device comprises a stick shaped and dimensioned to be capable of being engaged in said hole, at least one arm hinged to a support fastened to one end of the stick, an eddy current sensor being embedded in said arm, and resilient means for urging the arm outwards against the inside surface of the hole.

Abstract: The invention relates to the identification of points of interest in a region of the surface of a part, by bringing a surface reference into intimate contact with said region, said surface reference consisting of a thin film sufficiently flexible to conform to the region, the thin film supporting tracks made of electrically conductive material, the passage of an eddy current probe over a track delivering a significant signal representative of the track, this representative signal corresponding to a point of interest thus identified in said region. The invention makes it possible in particular to optimize the path and the angular position of an eddy current probe scanning a region of a part to be tested.