Abstract: A display device includes a first pixel region including a plurality of first pixels and a plurality of first gate control lines coupled to the first pixels, and a second pixel region spaced apart from the first pixel region. The second pixel region includes a plurality of second pixels and a plurality of second gate control lines coupled to the second pixels. The display device further includes a first non-pixel region disposed between the first pixel region and the second pixel region, and a first coupling line disposed in the first non-pixel region. The first coupling line commonly couples at least two first gate control lines and at least two second gate control lines.

Abstract: Provided is a semiconductor test board which includes a power supply, a first temperature resistive element and a second temperature resistive element configured to commonly receive power from the power supply and having resistances that varies with temperature, a first chip embedding unit configured to receive the power through the first temperature resistive element and having a first semiconductor package embedded therein, and a second chip embedding unit configured to receive the power through the second temperature resistive element and having a second semiconductor package embedded therein.