Abstract: Disclosed herein are a method for forming a pattern on a surface of a board and a pattern-formed board manufactured by the method. The method includes: arranging hot-fix pieces (10) in a predetermined form, thus forming a hot-fix-piece pattern unit (100); maintaining the hot-fix-piece pattern unit (100) and temporarily-adhering temporary adhesive tape to dome-shaped parts (10c) of the hot-fix pieces (10) of the hot-fix-piece pattern unit (100); disposing adhesive layers (10b) of the hot-fix pieces (10) of the hot-fix-piece pattern unit (100) and applying heat to the thin plate (12) so that the adhesive layers (10b) of the hot-fix pieces (10) are attached to the thin plate (12); applying an adhesive to a rear surface of the thin plate (12) and attaching the thin plate (12) to an opening and closing board (13); and surface-treating the opening and closing board (13).

Abstract: The present disclosure suggests a method of manufacturing flake aluminum oxide using a microwave including: performing a pre-treatment on a starting material by grinding the starting material such as alumina hydrate, aluminum salt or the like and classifying particles with an appropriate size; manufacturing transition alumina by performing a heat treatment by means of heating the pre-treated starting material; mixing the transition alumina with molten salt and an additive and then dispersing and grinding the mixed compounds; melting and synthesizing flake aluminum oxide by heating the dispersed and grinded mixture with a microwave as a heating source; separating the molten salt and the additive from the synthesized aluminum oxide; and performing a post-treatment on the flake aluminum oxide by removing a foreign substance such as an additive residue stuck to a surface of a crystal particle of the separated flake aluminum oxide.

Abstract: The present invention relates to phthalocyanine compound of poly cross-linking type which is represented with the below formula 1 and is useful for preventing forgery and alternation due to a rapid velocity being responded to a gamma ray of Neutron, and an ink composition comprising it. wherein, M1 and M2 are any one selected from a group consisted of a metal, a metal oxide or a metal halide respectively and may be same or different, R is a hydrogen atom, a halogen atom, a hydroxyl group, an amino group, a hydroxysulfonyl group, an aminosulfonyl group, or an alky group having a substituent group having from 1 to 20 carbon atoms, and n is an integer of 0˜3.

Abstract: The present disclosure suggests a method of manufacturing flake aluminum oxide using a microwave including: performing a pre-treatment on a starting material by grinding the starting material such as alumina hydrate, aluminum salt or the like and classifying particles with an appropriate size; manufacturing transition alumina by performing a heat treatment by means of heating the pre-treated starting material; mixing the transition alumina with molten salt and an additive and then dispersing and grinding the mixed compounds; melting and synthesizing flake aluminum oxide by heating the dispersed and grinded mixture with a microwave as a heating source; separating the molten salt and the additive from the synthesized aluminum oxide; and performing a post-treatment on the flake aluminum oxide by removing a foreign substance such as an additive residue stuck to a surface of a crystal particle of the separated flake aluminum oxide.

Abstract: A photolithography process facility comprising a substrate treating apparatus, the substrate treating apparatus includes a temperature control plate controlling a temperature a substrate, a central supporter having a pin shape vertically penetrating the temperature control plate and supporting a central region of substrate, and a collision preventer preventing a collision between the substrate and the temperature control plate.

Abstract: The present invention relates to phthalocyanine compound of poly cross-linking type which is represented with the below formula 1 and is useful for preventing forgery and alternation due to a rapid velocity being responded to a gamma ray of Neutron, and an ink composition comprising it. wherein, M1 and M2 are any one selected from a group consisted of a metal, a metal oxide or a metal halide respectively and may be same or different, R is a hydrogen atom, a halogen atom, a hydroxyl group, an amino group, a hydroxysulfonyl group, an aminosulfonyl group, or an alky group having a substituent group having from 1 to 20 carbon atoms, and n is an integer of 0˜3.

Abstract: The present invention relates to a functional fiber for preventing forgery, more particularly functional fiber for preventing forgery which exerts functionality by mixing special pigments to composite fibers of side by side shape on which two components are attached. The functional fibers of two components structure according to the present invention are consisted of synthetic high molecules, and have functionality which fibers display color by colored pigments with visual or fluorescence by light of ultraviolet ray or absorbing property of infrared pigments by being produced by mixing colored pigments, fluorescent pigments, infrared pigments and the like to each resin, and then melt-spinning the said mixture, or post treating it.

Abstract: The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor film and the loss tangent of a dielectric are determined using the Q-factor. The penetration depth ? for the superconductor film is measured using a dielectric resonator with a small gap between the superconductor film at the top of the resonator and the rest. The intrinsic surface resistance of superconductor films for calibration is determined using the measured RSeff and ? while the intrinsic surface resistance of a conductor film for calibration is determined using the measured RSeff and the nature of the intrinsic surface resistance being equal to the intrinsic surface reactance.

Abstract: The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor film and the loss tangent of a dielectric are determined using the Q-factor. The penetration depth ? for the superconductor film is measured using a dielectric resonator with a small gap between the superconductor film at the top of the resonator and the rest. The intrinsic surface resistance of superconductor films for calibration is determined using the measured RSeff and ? while the intrinsic surface resistance of a conductor film for calibration is determined using the measured RSeff and the nature of the intrinsic surface resistance being equal to the intrinsic surface reactance.

Abstract: A chuck assembly for high density plasma equipment includes: a chuck having an upper surface and a plurality of pin holes formed in an outer peripheral portion, wherein the chuck upper surface is configured to receive a semiconductor substrate thereon; a substrate guide disposed on an outer surface of the chuck, wherein the substrate guide is configured to prevent a semiconductor substrate positioned on the upper surface of the chuck from being separated from the chuck; a fixing plate disposed at a lower portion of the chuck; a plurality of lift pins secured to the fixing plate and extending in an upward direction from the fixing plate so that each lift pin is inserted into a respective one of the pin holes, wherein each lift pin has an upper surface that extends to a position adjacent to the upper surface of the chuck; and a chuck lifter penetrating the fixing plate and engaged with a lower portion of the chuck, wherein the chuck lifter is configured to move the chuck upward and downward.