Patents by Inventor Sang-Goo JUNG

Sang-Goo JUNG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Display device
    Patent number: 11956997
    Abstract: A display device according to an exemplary embodiment includes: a substrate including a display area and a transmission area; a metal blocking layer disposed in the display area of the substrate; an inorganic insulating layer disposed on the metal blocking film; a transistor disposed on the inorganic insulating layer; an emission layer connected to the transistor; and a light blocking layer and a color filter disposed on the emission layer of the display area, wherein the edge of the light blocking layer is protruded toward the transmission area more than the edge of the metal blocking layer.
    Type: Grant
    Filed: August 23, 2021
    Date of Patent: April 9, 2024
    Assignee: Samsung Display Co., Ltd.
    Inventors: Se Wan Son, Nak Cho Choi, Moo Soon Ko, Dong Hyun Son, Sang Hoon Oh, Jin Goo Jung, Kyung Hyun Choi, Hae-Yeon Lee, Seong Min Cho
  • Semiconductor device, test structure of the semiconductor device, and method of testing the semiconductor device
    Patent number: 9291669
    Abstract: A semiconductor device, a test structure of the semiconductor device, and a method of testing the semiconductor device are provided. The test structure including a first pad and a second pad being separated from each other, and a first test element and a second test element connected between the first pad and the second pad, a first value of a characteristic parameter of the first test element being different from a second value of the characteristic parameter of the second test element, may be provided.
    Type: Grant
    Filed: August 28, 2014
    Date of Patent: March 22, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jin-Myoung Lee, Il-Kwon Lee, Jun-Woo Lee, Sang-Goo Jung, Kyoung-Mi Park, In-Ae Lee
  • SEMICONDUCTOR DEVICE, TEST STRUCTURE OF THE SEMICONDUCTOR DEVICE, AND METHOD OF TESTING THE SEMICONDUCTOR DEVICE
    Publication number: 20150113343
    Abstract: A semiconductor device, a test structure of the semiconductor device, and a method of testing the semiconductor device are provided. The test structure including a first pad and a second pad being separated from each other, and a first test element and a second test element connected between the first pad and the second pad, a first value of a characteristic parameter of the first test element being different from a second value of the characteristic parameter of the second test element, may be provided.
    Type: Application
    Filed: August 28, 2014
    Publication date: April 23, 2015
    Inventors: Jin-Myoung LEE, Il-Kwon LEE, Jun-Woo LEE, Sang-Goo JUNG, Kyoung-Mi PARK, In-Ae LEE