Abstract: An object recognition device including an artificial neural network (NN) engine configured to receive learning data and weights, make an object recognition model (ORM) learn by using the received information, and provide selected weight data including weights from the selected portion of the weights, and further configured to receive a feature vector, and apply the feature vector extracted from an object data that constructs the object and the selected weight data to the learned ORM to provide an object recognition result, a nonvolatile memory (NVM) configured to store the learned ORM, and an error correction code (ECC) engine configured to perform an ECC encoding on the selected weight data to generate parity data, provide the selected weight data and the parity data to the NVM, and provide the selected weight data to the NN engine by performing an ECC decoding on the selected weight data based on the parity data.

Abstract: An object recognition device including an artificial neural network (NN) engine configured to receive learning data and weights, make an object recognition model (ORM) learn by using the received information, and provide selected weight data including weights from the selected portion of the weights, and further configured to receive a feature vector, and apply the feature vector extracted from an object data that constructs the object and the selected weight data to the learned ORM to provide an object recognition result, a nonvolatile memory (NVM) configured to store the learned ORM, and an error correction code (ECC) engine configured to perform an ECC encoding on the selected weight data to generate parity data, provide the selected weight data and the parity data to the NVM, and provide the selected weight data to the NN engine by performing an ECC decoding on the selected weight data based on the parity data.

Abstract: A nonvolatile memory device includes a memory cell array including a plurality of nonvolatile memory cells; a page buffer circuit connected to the memory cell array through a plurality of bit lines; a calculation circuit configured to perform a calculation on information bits and weight bits based on a calculation window having a first size, the information bits and weight bits being included in a user data set, the memory cell array being configured to store the user data set, the calculation circuit being further configured to receive the user data set through the page buffer circuit; and a data input/output (I/O) circuit connected to the calculation circuit, wherein the calculation circuit is further configured to provide an output data set to the data I/O circuit in response to the calculation circuit completing the calculation with respect to all of the information bits and the weight bits, and wherein the output data set corresponds to a result of the completed calculation.

Abstract: An object recognition device including an artificial neural network (NN) engine configured to receive learning data and weights, make an object recognition model (ORM) learn by using the received information, and provide selected weight data including weights from the selected portion of the weights, and further configured to receive a feature vector, and apply the feature vector extracted from an object data that constructs the object and the selected weight data to the learned ORM to provide an object recognition result, a nonvolatile memory (NVM) configured to store the learned ORM, and an error correction code (ECC) engine configured to perform an ECC encoding on the selected weight data to generate parity data, provide the selected weight data and the parity data to the NVM, and provide the selected weight data to the NN engine by performing an ECC decoding on the selected weight data based on the parity data.

Abstract: A nonvolatile memory device includes a memory cell array including a plurality of nonvolatile memory cells; a page buffer circuit connected to the memory cell array through a plurality of bit lines; a calculation circuit configured to perform a calculation on information bits and weight bits based on a calculation window having a first size, the information bits and weight bits being included in a user data set, the memory cell array being configured to store the user data set, the calculation circuit being further configured to receive the user data set through the page buffer circuit; and a data input/output (I/O) circuit connected to the calculation circuit, wherein the calculation circuit is further configured to provide an output data set to the data I/O circuit in response to the calculation circuit completing the calculation with respect to all of the information bits and the weight bits, and wherein the output data set corresponds to a result of the completed calculation.

Abstract: A nonvolatile memory device includes a memory cell array configured to store an authentication key and authentication key configuration information in first and second pluralities of nonvolatile memory cells, along with data whose security is to be protected, and a control circuit controlling an operation of the memory cell array.

Abstract: A memory device may include a normal cell which is configured to be programmed to a first resistance and stabilized as a resistance of the normal cell drifts from the first resistance to a second resistance; a flag cell which is configured to be programmed to a third resistance smaller than the first resistance and stabilized as a resistance of the flag cell drifts from the third resistance to a fourth resistance smaller than the second resistance; and a decision circuit which is configured to decide whether the flag cell has been stabilized in order to determine whether the normal cell has been stabilized.

Abstract: A method of operating a PRAM device includes reading a PRAM reference cell to determine an initial programmed resistance of the PRAM reference cell and determining whether the initial programmed resistance has been reduced to below a predetermined reference threshold resistance.

Abstract: A nonvolatile memory device includes a memory cell array configured to store an authentication key and authentication key configuration information in first and second pluralities of nonvolatile memory cells, along with data whose security is to be protected, and a control circuit controlling an operation of the memory cell array.

Abstract: In a method of programming a phase change memory device, write data is programmed in a plurality of phase change memory cells by applying write pulses to each of the plurality of phase change memory cells. Whether each of the phase change memory cells is programmed is verified by applying verification pulses to each of the phase-change memory cells. A number of applications for the verification pulses and the intervals between respective applications of the verification pulses are varied in accordance with a verification result for each of the phase-change memory cells.

Abstract: A method of operating a PRAM device can be provided by reading a PRAM reference cell to determine an initial programmed resistance of the PRAM reference cell and determining whether the initial programmed resistance has been reduced to below a predetermined reference threshold resistance.

Abstract: A method of programming a phase change memory device is disclosed. Write data is programmed in a plurality of phase change memory cells by applying write pulses to each of the plurality of phase change memory cells. Whether each of the phase change memory cells is programmed is verified by applying at least one verification pulse to each of the phase-change memory cells. A number of applications for the at least one verification pulse and the intervals between respective applications of the at least one verification pulse are varied in accordance with a verification result for each of the phase-change memory cells.

Abstract: A method of processing data in a resistive memory device comprises performing a write operation to store data into a resistive memory of the resistive memory device and to store program information of the data into a cache memory. The method further comprises performing a first read operation to read the program information from the cache memory during a program-to-active time, and a second read operation to read the data from the resistive memory after the program-to-active time if the program information is not read from the cache memory during the program-to-active time.

Abstract: A multi-level EEPROM cell and a method of manufacture thereof are provided so as to improve a program characteristic of the multi-level cell. For the purpose, the multi-level flash EEPROM cell includes a floating gate formed as being electrically separated from a silicon substrate by an underlying tunnel oxide layer, a first dielectric layer formed over the top of the floating gate, a first control gate formed on the floating gate as being electrically separated from the floating gate by the first dielectric layer, a second dielectric layer formed on the sidewall and top of the first control gate, a second control gate formed on the sidewall and top of the first control gate as being electrically separated from the first control gate by the second dielectric layer, and a source and drain formed in the substrate as being self-aligned with both edges of the second control gate.

Abstract: A multi-level EEPROM cell and a method of manufacture thereof are provided so as to improve a program characteristic of the multi-level cell. For the purpose, the multi-level flash EEPROM cell includes a floating gate formed as being electrically separated from a silicon substrate by an underlying tunnel oxide layer, a first dielectric layer formed over the top of the floating gate, a first control gate formed on the floating gate as being electrically separated from the floating gate by the first dielectric layer, a second dielectric layer formed on the sidewall and top of the first control gate, a second control gate formed on the sidewall and top of the first control gate as being electrically separated from the first control gate by the second dielectric layer, and a source and drain formed in the substrate as being self-aligned with both edges of the second control gate.

Abstract: A multi-level EEPROM cell and a method of manufacture thereof are provided so as to improve a program characteristic of the multi-level cell. For the purpose, the multi-level flash EEPROM cell includes a floating gate formed as being electrically separated from a silicon substrate by an underlying tunnel oxide layer, a first dielectric layer formed over the top of the floating gate, a first control gate formed on the floating gate as being electrically separated from the floating gate by the first dielectric layer, a second dielectric layer formed on the sidewall and top of the first control gate, a second control gate formed on the sidewall and top of the first control gate as being electrically separated from the first control gate by the second dielectric layer, and a source and drain formed in the substrate as being self-aligned with both edges of the second control gate.

Abstract: There is disclosed a method of monitoring a source contact in a flash memory by which whether a source contact having a narrow contact area contacts or not can be easily monitored using over-erase cell characteristic in a flash cell, in a flash memory device in which a source line is formed by a local interconnection method. In the present invention, in order to monitor a contact state at source contacts, the same voltage to the erase condition of a cell is applied to respective terminals (VG terminal, VD terminal, VS terminal and VSS terminal) wherein all the electrons existing at a floating gate in all the cells connected to the VS terminal and VSS terminal become turned on so that they can be over-erased. On the other hands, as electrons existing at the floating gate in two cells shared by any source contacts having a defect contact are not erased, the cells remain turn-off.

Abstract: There is disclosed a method of manufacturing a flash memory device. In order to solve the problems that a well resistance and a parasitic capacitance are great and the erase speed of a device is slow in case of the conventional flash memory device, the present invention forms a well region of a sector unit by use of a metal silicide layer and defines an unit cell by use of a ploysilicon layer. Thus, it can reduce the well resistance and the parasitic capacitance. Also, it can improve the operating speed of the device and can reduce the manufacturing cost by allowing the erase operation of a cell unit.

Abstract: There is disclosed a multi-bit flash memory cell and programming method using the same. In order to solve the problems that the size of a cell per unit is increased, reliability of a device is degraded due to a high operating voltage and a circuit necessary for driving the cell becomes complicated, the multi-bit flash memory cell and programming method using the same according to the present invention stores information of various states, by interchangeably programs a drain and a source in a cell array of virtual ground type, in a structure in which that two types of cells look like connected serially by doping a floating gate in a flash memory cell with two regions of a N type and a P to type.

Abstract: A multi-level EEPROM cell and a method of manufacture thereof are provided so as to improve a program characteristic of the multi-level cell. For the purpose, the multi-level flash EEPROM cell includes a floating gate formed as being electrically separated from a silicon substrate by an underlying tunnel oxide layer, a first dielectric layer formed over the top of the floating gate, a first control gate formed on the floating gate as being electrically separated from the floating gate by the first dielectric layer, a second dielectric layer formed on the sidewall and top of the first control gate, a second control gate formed on the sidewall and top of the first control gate as being electrically separated from the first control gate by the second dielectric layer, and a source and drain formed in the substrate as being self-aligned with both edges of the second control gate.