Abstract: The present invention provides an optical adhesive sheet including a layered structure of a first adhesive layer and a second adhesive layer, in which the first adhesive layer has a glass transition temperature of ?50° C. to ?30° C. and a modulus of 0.3×105 Pa to about 0.6×105 Pa, and the second adhesive layer has a glass transition temperature of ?20° C. to ?10° C. and a modulus of 0.7×105 Pa to 1.0×105 Pa.

Abstract: Provided are an adhesive bonding composition for optical use and a multistage curing method thereof, the composition including a methacrylate-based monomer and an acrylate-based monomer, in which a weight ratio of the methacrylate-based monomer to the acrylate-based monomer ranges from about 1:1 to about 1:10.

Abstract: Disclosed herein are electrolyte compositions comprising: a) a first solvent comprising a cyclic carbonate; b) a second solvent comprising a non-fluorinated acyclic carbonate; c) at least one electrolyte component selected from: i) a fluorinated acyclic carboxylic acid ester; ii) a fluorinated acyclic carbonate; iii) a fluorinated acyclic ether; or iv) a mixture thereof; and d) an electrolyte salt; wherein the electrolyte component is present in the electrolyte composition in the range of from about 0.05 weight percent to about 10 weight percent, based on the total weight of the first and second solvents.

Abstract: A method and system for die compensation and restoration uses high-velocity oxy-fuel (HVOF) thermal spray coating and plasma ion nitriding to compensate for a particular part (damaged part) of a press die that causes formation of fine curves at a door of a vehicle to restore it to its original state. A coating thickness quantification technique may precisely compensate for the damaged part of the die that causes formation of the fine curves at the door of the vehicle in a circular form using HVOF thermal spray coating. A surface of the die may be nitrided using plasma ion nitriding after HVOF thermal spray coating is performed, so as to harden the surface of the die so that wear resistance and fatigue resistance of the die can be greatly improved and the hardfacing or overlay welding efficiency of the die can be increased.

Abstract: A liquid crystal display includes a first display panel and a second display panel facing each other, a driver connecting line disposed on the first display panel, a driving circuit part connected to the driver connecting line, a backlight unit disposed adjacent to the first display panel, a reinforcing part overlapping the driver connecting line and disposed adjacent to at least one side of the second display panel, a second polarizer disposed on the second display panel, and a film layer disposed on the second polarizer and the reinforcing part. The second polarizer overlaps a top surface of the second display panel and does not overlap a top surface of the reinforcing part.

Abstract: A magnetic memory device includes a reference magnetic structure, a free magnetic structure, and a tunnel barrier pattern between the reference magnetic structure and the free magnetic structure. The reference magnetic structure includes a first pinned pattern, a second pinned pattern between the first pinned pattern and the tunnel barrier pattern, and an exchange coupling pattern between the first and the second pinned pattern. The second pinned pattern includes a first magnetic pattern adjacent the exchange coupling pattern, a second magnetic pattern adjacent the tunnel barrier pattern, a third magnetic pattern between the first and the second magnetic pattern, a first non-magnetic pattern between the first and the third magnetic pattern, and a second non-magnetic pattern between the second and the third magnetic pattern. The first non-magnetic pattern has a different crystal structure from the second non-magnetic pattern, and at least a portion of the third magnetic pattern is amorphous.

Abstract: Provided are a method and a system capable of efficiently detecting security vulnerability of program. The method includes: generating binary information including route information indicating an execution route of a program on a first test case; acquiring first crash information including the first test case and the route information when a crash of the first test case occurs; restoring a control flow graph based on the binary information; calculating complexity of the restored control flow graph; determining whether the complexity is less than a threshold value; only when a result of the determination indicates that the complexity is less than a threshold value, performing: executing a route detection on the route information; generating a second test case by executing the route detection; and acquiring a second crash information including the second test case and the route information.

Abstract: In a method of inspecting liquid chemicals discharged from an ink jet head according to example embodiments, at least two laser beams may be irradiated onto the liquid chemicals discharged from the ink jet head, and the conditions of the liquid chemicals may be identified by detecting an interference pattern obtained from a laser scattering generated by passing the liquid chemicals through the at least two laser beams.

Abstract: A display device may include a display panel having a curved shape, a first printed circuit board and a second printed circuit board, at least one first carrier tape configured to connect the first printed circuit board to the display panel, at least one second carrier tape configured to connect the second printed circuit board to the display panel, and a connection unit configured to connect the first and second printed circuit boards to each other. A part of a layer of the connection unit may be a portion of a layer included in at least one of the first and second printed circuit boards.

Abstract: Provided are a binary vulnerability analysis method performed by a computing device is provided, and the binary vulnerability analysis method includes a primary execution step of recording a symbolic constraint of a vulnerability associated with an execution flow path causing a crash to a target binary to be analyzed and a suspicious element on the execution flow path by performing taint analysis through a primary execution of the target binary; and a secondary execution step of performing a secondary execution, which is a symbolic execution, on the execution flow path and, if an instruction satisfying the symbolic constraint is found, determining that the vulnerability exists in the target binary by comparing the suspicious element and the found instruction.

Abstract: A liquid crystal display includes a first display panel and a second display panel facing each other, a driver connecting line disposed on the first display panel, a driving circuit part connected to the driver connecting line, a backlight unit disposed adjacent to the first display panel, a reinforcing part overlapping the driver connecting line and disposed adjacent to at least one side of the second display panel, a second polarizer disposed on the second display panel, and a film layer disposed on the second polarizer and the reinforcing part. The second polarizer overlaps a top surface of the second display panel and does not overlap a top surface of the reinforcing part.

Abstract: Provided are a binary vulnerability analysis method performed by a computing device is provided, and the binary vulnerability analysis method includes a primary execution step of recording a symbolic constraint of a vulnerability associated with an execution flow path causing a crash to a target binary to be analyzed and a suspicious element on the execution flow path by performing taint analysis through a primary execution of the target binary; and a secondary execution step of performing a secondary execution, which is a symbolic execution, on the execution flow path and, if an instruction satisfying the symbolic constraint is found, determining that the vulnerability exists in the target binary by comparing the suspicious element and the found instruction.

Abstract: Provided are sputtering apparatuses and methods of manufacturing magnetic memory devices. The sputtering apparatus includes a process chamber, a stage in the process chamber and configured to load a substrate thereon, and a first sputter gun above the substrate in the process chamber. The first sputter gun is horizontally spaced apart from the substrate. The first sputter gun includes a first target including a first end and a second end, the first end being horizontally closer to the substrate than the second end. A first surface of the first target is inclined relative to a top surface of the substrate. A height of the second end of the first target relative to the top surface of the substrate is greater than that of the first end of the first target.

Abstract: A fire resistant cable comprising a conductor and a sheath surrounding the conductor, the cable is characterized in further comprising: a bedding filler arranged between the conductor and the sheath and made of materials providing fire resistance; and, a tunnel filler arranged between the conductor and the sheath in the longitudinal direction of the cable, and having a melting point lower than the combustion point of the bedding filler.

Abstract: Provided are a method and a system capable of efficiently detecting security vulnerability of program. The system for detecting the security vulnerability according to an embodiment of the present invention includes a vulnerability detecting module that acquires crash information, a binary analysis module that determines priority of binary information and whether to execute the route detection, and a route detecting module that executes the route detection to generate a new test case.

Abstract: Provided is an adhesive composition including: a (meth)acrylic acid ester-based photo-curable resin; and an oxygen-free di-functional diene-based rubber hardener.

Abstract: A display device includes a display panel including a substrate and a plurality of display elements disposed on the substrate, and a diffraction panel including a plurality of diffraction patterns disposed on a path of light emitted from the plurality of display elements. The plurality of diffraction patterns are disposed in a first direction to have a first period, each of the plurality of diffraction patterns includes a first refractive layer, a second refractive layer disposed on the first refractive layer, and a third refractive layer disposed on the second refractive layer, and a refractive index of the second refractive layer is higher than a refractive index of the first refractive layer and a refractive index of the third refractive layer.

Abstract: A semiconductor memory device includes free magnetic pattern on a substrate, a reference magnetic pattern on the free magnetic pattern, the reference magnetic pattern including a first pinned pattern, a second pinned pattern, and an exchange coupling pattern between the first and second pinned patterns, a tunnel barrier pattern between the reference magnetic pattern and the free magnetic pattern, a polarization enhancement magnetic pattern between the tunnel barrier pattern and the first pinned pattern, and an intervening pattern between the polarization enhancement magnetic pattern and the first pinned pattern, wherein the first pinned pattern includes first ferromagnetic patterns and anti-ferromagnetic exchange coupling patterns which are alternately stacked.

Abstract: A display device comprising: a substrate; a plurality of display elements disposed on the substrate; and a diffraction pattern layer disposed on a path of light emitted from the plurality of display elements. The diffraction pattern layer comprises a plurality of diffraction patterns which is disposed with a predetermined pitch, and the plurality of diffraction patterns do not overlap the plurality of display elements; and when a width of a cross section of each of the plurality of diffraction patterns is defined as a length of each diffraction pattern, the predetermined pitch and the length of each diffraction pattern satisfy the following inequation: 0.4?d1/DP1<1, where DP1 denotes the predetermined pitch, and d1 denotes the length of each diffraction pattern.

Abstract: An automatic RF filter tuning system and a method for manufacturing a filter using the same are disclosed. An RF filter tuning system for tuning an RF filter that includes a plurality of cavities having resonance elements and a cover having tuning areas that are positioned correspondingly to the resonance elements, includes a measuring unit configured to measure resonance characteristics of the cavity of the RF filter, a control unit configured to calculate a tuning value of the RF filter based on the resonance characteristics, and a tuning unit configured to tune the RF filter based on the tuning value calculated by the control unit. The tuning unit includes a striking unit configured to strike the tuning area of the cover of the RF filter, thereby adjusting the resonance value and tuning the RF filter.