Patents by Inventor Sang-Min Ju

Sang-Min Ju has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8308966
    Abstract: A method for performing a double pattering process of a semiconductor device is provided. The method includes forming a hard mask layer having a stack structure of a first layer, a second layer and a third layer in sequence, forming a first photoresist pattern over the hard mask layer, etching the third layer to form third layer patterns by using the first photoresist pattern as an etch barrier, forming a second photoresist pattern over the third layer patterns, etching the second layer to form second layer patterns by using the second photoresist pattern and the third layer patterns as an etch barrier, removing the second photoresist pattern, and etching the first layer to form first layer patterns by using the second layer patterns as an etch barrier.
    Type: Grant
    Filed: June 30, 2009
    Date of Patent: November 13, 2012
    Assignee: Hynix Semiconductor, Inc.
    Inventors: Jun-Hyeub Sun, Shi-Young Lee, Jong-Sik Bang, Sang-Min Ju
  • Publication number: 20100248491
    Abstract: A method for performing a double pattering process of a semiconductor device is provided. The method includes forming a hard mask layer having a stack structure of a first layer, a second layer and a third layer in sequence, forming a first photoresist pattern over the hard mask layer, etching the third layer to form third layer patterns by using the first photoresist pattern as an etch barrier, forming a second photoresist pattern over the third layer patterns, etching the second layer to form second layer patterns by using the second photoresist pattern and the third layer patterns as an etch barrier, removing the second photoresist pattern, and etching the first layer to form first layer patterns by using the second layer patterns as an etch barrier.
    Type: Application
    Filed: June 30, 2009
    Publication date: September 30, 2010
    Inventors: Jun-Hyeub Sun, Shi-Young Lee, Jong-Sik Bang, Sang-Min Ju